AFM‐Based Functional Tomography – To Mill or Not to Mill, that is the Question!

AFM‐Based Functional Tomography – To Mill or Not to Mill, that is the Question!

Abstract The electrical response of ferroelectric domain walls is often influenced by their geometry underneath the sample surface. Tomographic imaging in these material systems has therefore become increasingly important for its ability to correlate the surface‐level functional response with subsur...

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Main Authors: Niyorjyoti Sharma, Kristina M. Holsgrove, James Dalzell, Conor J. McCluskey, Jilai He, Dennis Meier, Dharmalingam Prabhakaran, Brian J. Rodriguez, Raymond G.P. McQuaid, J. Marty Gregg, Amit Kumar
Format: Article
Language:English
Published: Wiley-VCH 2025-05-01
Series:Advanced Materials Interfaces
Subjects:
atomic force microscopy
domain walls
ferroelectrics
functional mapping
milling
Online Access:https://doi.org/10.1002/admi.202400813
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https://doi.org/10.1002/admi.202400813

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