Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions
This paper investigates the features of using modified Hamming codes, which are also known as Hsiao codes. Self-checking digital devices are proposed to be implemented with calculations testing using two diagnostic signs. These signs indicate that the functions (there are functions that describe che...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-01-01
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| Series: | Computation |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-3197/13/1/15 |
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| Summary: | This paper investigates the features of using modified Hamming codes, which are also known as Hsiao codes. Self-checking digital devices are proposed to be implemented with calculations testing using two diagnostic signs. These signs indicate that the functions (there are functions that describe check bits) belong to the class of self-dual Boolean functions and also belong to the codewords of Hsiao codes (these are codes with an odd column of weights). The authors have established that all check functions can be self-dual for a certain number of the Hsiao codes’ data symbols. Such codes can be used in the synthesis of concurrent error-detection circuits by two diagnostic signs. The paper describes the structure of an organization for a concurrent error-detection circuit based on Hsiao codes with self-dual check functions. Some experimental results are presented on the synthesis of self-checking devices using the proposed methodology. The controllability of the structure and the number of test combinations both increased. Hsiao codes can be effectively used with self-dual check functions in the synthesis of self-checking digital devices. |
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| ISSN: | 2079-3197 |