APA (7th ed.) Citation

Efanov, D. V., Pogodina, T. S., Aripov, N. M., Boltayev, S. T., Azizov, A. R., Ametova, E. K., & Shakirova, F. F. Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions. MDPI AG.

Chicago Style (17th ed.) Citation

Efanov, Dmitry V., Tatiana S. Pogodina, Nazirjan M. Aripov, Sunnatillo T. Boltayev, Asadulla R. Azizov, Elnara K. Ametova, and Feruza F. Shakirova. Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions. MDPI AG.

MLA (9th ed.) Citation

Efanov, Dmitry V., et al. Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions. MDPI AG.