Impact of Observation Time Window on RTN-Induced Jitter in CMOS Ring Oscillators
At nanometer scale device dimensions, factors that lead to integrated circuit performance variations from one instant in time to another become increasingly significant. Random Telegraph Noise (RTN) is one of the relevant time-dependent variability sources. We perform a simple, physically based anal...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/11031463/ |
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