A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines
A novel measurement technique has been developed to enhance the accuracy of insertion loss measurements using vector network analyzers (VNAs), addressing the challenge of data fluctuations — a critical factor in determining circuit bandwidth and ensuring high-frequency signal integrity. T...
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| Format: | Article |
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IEEE
2025-01-01
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| Series: | IEEE Access |
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| Online Access: | https://ieeexplore.ieee.org/document/10967499/ |
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| author | Ching-Wen Tang Wei-Lun Tsai Chieh Lee You-Lin Luo |
| author_facet | Ching-Wen Tang Wei-Lun Tsai Chieh Lee You-Lin Luo |
| author_sort | Ching-Wen Tang |
| collection | DOAJ |
| description | A novel measurement technique has been developed to enhance the accuracy of insertion loss measurements using vector network analyzers (VNAs), addressing the challenge of data fluctuations — a critical factor in determining circuit bandwidth and ensuring high-frequency signal integrity. The proposed method employs a Point-wise Least Squares (PLS) approach, eliminating the need for manual selection of smoothing bandwidth and simplifying the measurement process with a dedicated flowchart. This technique accurately differentiates insertion loss variations in microstrip lines, even across the Ka-band frequency range, ensuring reliable and consistent data by reducing deviations, particularly at band edges. The improved measurement accuracy supports the design and optimization of high-performance communication systems. |
| format | Article |
| id | doaj-art-070d90c2eafc420ba28f5b5259adc503 |
| institution | OA Journals |
| issn | 2169-3536 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj-art-070d90c2eafc420ba28f5b5259adc5032025-08-20T02:19:48ZengIEEEIEEE Access2169-35362025-01-0113699987000510.1109/ACCESS.2025.356173810967499A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip LinesChing-Wen Tang0https://orcid.org/0000-0001-7887-1189Wei-Lun Tsai1https://orcid.org/0009-0008-3140-0433Chieh Lee2https://orcid.org/0009-0004-1121-8619You-Lin Luo3https://orcid.org/0009-0006-6546-7391Department of Communications Engineering, National Chung Cheng University, Chiayi, TaiwanDepartment of Electrical Engineering, National Chung Cheng University, Chiayi, TaiwanDepartment of Electrical Engineering, National Chung Cheng University, Chiayi, TaiwanDepartment of Electrical Engineering, National Chung Cheng University, Chiayi, TaiwanA novel measurement technique has been developed to enhance the accuracy of insertion loss measurements using vector network analyzers (VNAs), addressing the challenge of data fluctuations — a critical factor in determining circuit bandwidth and ensuring high-frequency signal integrity. The proposed method employs a Point-wise Least Squares (PLS) approach, eliminating the need for manual selection of smoothing bandwidth and simplifying the measurement process with a dedicated flowchart. This technique accurately differentiates insertion loss variations in microstrip lines, even across the Ka-band frequency range, ensuring reliable and consistent data by reducing deviations, particularly at band edges. The improved measurement accuracy supports the design and optimization of high-performance communication systems.https://ieeexplore.ieee.org/document/10967499/Calibrationmicrostrip linesmoothing methodtest fixturevector network analyzer |
| spellingShingle | Ching-Wen Tang Wei-Lun Tsai Chieh Lee You-Lin Luo A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines IEEE Access Calibration microstrip line smoothing method test fixture vector network analyzer |
| title | A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines |
| title_full | A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines |
| title_fullStr | A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines |
| title_full_unstemmed | A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines |
| title_short | A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines |
| title_sort | novel vna enhanced technique for ka band insertion loss measurement in microstrip lines |
| topic | Calibration microstrip line smoothing method test fixture vector network analyzer |
| url | https://ieeexplore.ieee.org/document/10967499/ |
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