A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines
A novel measurement technique has been developed to enhance the accuracy of insertion loss measurements using vector network analyzers (VNAs), addressing the challenge of data fluctuations — a critical factor in determining circuit bandwidth and ensuring high-frequency signal integrity. T...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10967499/ |
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