A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines
A novel measurement technique has been developed to enhance the accuracy of insertion loss measurements using vector network analyzers (VNAs), addressing the challenge of data fluctuations — a critical factor in determining circuit bandwidth and ensuring high-frequency signal integrity. T...
Saved in:
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
|
| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10967499/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Summary: | A novel measurement technique has been developed to enhance the accuracy of insertion loss measurements using vector network analyzers (VNAs), addressing the challenge of data fluctuations — a critical factor in determining circuit bandwidth and ensuring high-frequency signal integrity. The proposed method employs a Point-wise Least Squares (PLS) approach, eliminating the need for manual selection of smoothing bandwidth and simplifying the measurement process with a dedicated flowchart. This technique accurately differentiates insertion loss variations in microstrip lines, even across the Ka-band frequency range, ensuring reliable and consistent data by reducing deviations, particularly at band edges. The improved measurement accuracy supports the design and optimization of high-performance communication systems. |
|---|---|
| ISSN: | 2169-3536 |