Tang, C., Tsai, W., Lee, C., & Luo, Y. A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines. IEEE.
Chicago Style (17th ed.) CitationTang, Ching-Wen, Wei-Lun Tsai, Chieh Lee, and You-Lin Luo. A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines. IEEE.
MLA (9th ed.) CitationTang, Ching-Wen, et al. A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines. IEEE.
Warning: These citations may not always be 100% accurate.