Performance Projection of Gate-All-Around (GAA)-Based Negative Capacitance Complementary FET (NC-CFET) Relative to Standard CFET

In this article, we have compared the negative capacitance complementary FET (NC-CFET) from a device-circuit perspective with the experimentally demonstrated CFET. NC-CFET could potentially offer additional advantages over conventional CFET, like enhancement in the sub-threshold behavior, reduction...

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Bibliographic Details
Main Authors: Abhishek Kumar, Shruti Mehrotra, Anand Bulusu, Avirup Dasgupta
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10758729/
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