Performance Projection of Gate-All-Around (GAA)-Based Negative Capacitance Complementary FET (NC-CFET) Relative to Standard CFET
In this article, we have compared the negative capacitance complementary FET (NC-CFET) from a device-circuit perspective with the experimentally demonstrated CFET. NC-CFET could potentially offer additional advantages over conventional CFET, like enhancement in the sub-threshold behavior, reduction...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10758729/ |
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