Broadband S-Parameter-Based Characterization of Multilayer Ceramic Capacitors Submitted to Mechanical Stress Through Bending Tests on a PCB
A full characterization of multilayer ceramic capacitors including variations in capacitance, series resistance, and series inductance is accomplished by measuring their RF response while being submitted to mechanical stress. This allows for the first time quantifying the degradation of the device’s...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-11-01
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| Series: | Micromachines |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2072-666X/15/11/1386 |
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