Multiple patho-phenotyping and molecular analysis to characterize wide-spectrum durable leaf rust resistance in wheat collections from India
Wheat leaf rust, caused by Puccinia triticina (Pt), is a globally prevalent fungal disease that causes significant economic loss. Cultivar resistance remains a cornerstone of the management of this pathogen. This study evaluated 86 Indian wheat (Triticum aestivum L.) genotypes to characterize leaf r...
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| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Frontiers Media S.A.
2025-07-01
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| Series: | Frontiers in Microbiology |
| Subjects: | |
| Online Access: | https://www.frontiersin.org/articles/10.3389/fmicb.2025.1596282/full |
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