Multiple patho-phenotyping and molecular analysis to characterize wide-spectrum durable leaf rust resistance in wheat collections from India

Multiple patho-phenotyping and molecular analysis to characterize wide-spectrum durable leaf rust resistance in wheat collections from India

Wheat leaf rust, caused by Puccinia triticina (Pt), is a globally prevalent fungal disease that causes significant economic loss. Cultivar resistance remains a cornerstone of the management of this pathogen. This study evaluated 86 Indian wheat (Triticum aestivum L.) genotypes to characterize leaf r...

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Bibliographic Details
Main Authors: Ram Mohan, Vaibhav Kumar Singh, K. K. Chetan, Lingareddy Usha Rani, Koshal K. Sameriya, Subodh Kumar, Naresh Kumar Bainsla, Govindasamy Senthilraja, Mahender Singh Saharan
Format: Article
Language:English
Published: Frontiers Media S.A. 2025-07-01
Series:Frontiers in Microbiology
Subjects:
wheat
Puccinia triticina
leaf rust
gene postulation
Lr genes
epidemiological parameters
Online Access:https://www.frontiersin.org/articles/10.3389/fmicb.2025.1596282/full
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https://www.frontiersin.org/articles/10.3389/fmicb.2025.1596282/full

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