Structural Analysis of Erbium-Doped Silica-Based Glass-Ceramics Using Anomalous and Small-Angle X-Ray Scattering
This study employs advanced structural characterization techniques, including anomalous small-angle X-ray scattering (ASAXS), small-angle X-ray scattering (SAXS), and X-ray photoelectron spectroscopy (XPS), to investigate erbium (Er<sup>3+</sup>)-doped silica-based glass-ceramic thin fil...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-02-01
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| Series: | Foundations |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2673-9321/5/1/5 |
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