APA (7th ed.) Citation

Shin, W., Lee, J. Y., Kim, J., Lee, S. Y., & Lee, S. Low-frequency noise analysis on asymmetric damage and self-recovery behaviors of ZnSnO thin-film transistors under hot carrier stress. Springer.

Chicago Style (17th ed.) Citation

Shin, Wonjun, Ji Ye Lee, Jangsaeng Kim, Sang Yeol Lee, and Sung-Tae Lee. Low-frequency Noise Analysis on Asymmetric Damage and Self-recovery Behaviors of ZnSnO Thin-film Transistors Under Hot Carrier Stress. Springer.

MLA (9th ed.) Citation

Shin, Wonjun, et al. Low-frequency Noise Analysis on Asymmetric Damage and Self-recovery Behaviors of ZnSnO Thin-film Transistors Under Hot Carrier Stress. Springer.