Tsang’s resolution enhancement method for imaging with focused illumination by Alexander Duplinskiy, Jernej Frank, Kaden Bearne, A. I. Lvovsky

“…Abstract A widely tested approach to overcoming the diffraction limit in microscopy without disturbing the sample relies on substituting widefield sample illumination with a structured light beam. This gives rise to confocal, image scanning, and structured illumination microscopy methods. …”
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