A Whale Optimization Algorithm-Based Data Fitting Method to Determine the Parameters of Films Measured by Spectroscopic Ellipsometry by Liyuan Ma, Xipeng Xu, Changcai Cui, Mai Gao, Tukun Li, Shan Lou, Paul J. Scott, Xiangqian Jiang, Wenhan Zeng

“…A data-fitting method based on the whale optimization algorithm (WOA) is proposed to determine the thickness and refractive index of films measured by spectroscopic ellipsometry (SE). …”
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20 kHz X-ray diffraction on Cu thin films explores thermomechanical fatigue at high strain-rates by T. Ziegelwanger, M. Reisinger, B. Vedad, K. Hlushko, S. Van Petegem, J. Todt, M. Meindlhumer, J. Keckes

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Existir no mapa: interfaces entre cartografia social e intervenção comunitária by Silvana Ribeiro, Henrique França Duara, Robert Filipe dos Passos, Mariele Aparecida Malaquias da Silva

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Annealing Heat Treatment of ZnO Nanoparticles Grown on Porous Si Substrate Using Spin-Coating Method by K. A. Eswar, J. Rouhi, H. F. Husairi, M. Rusop, S. Abdullah

“…The postannealing treatments were investigated on morphologies and photoluminescence (PL) properties of the ZnO thin films. Field emission scanning electron microscopy (FESEM) results indicate that the thin films composed by ZnO nanoparticles were distributed uniformly on PSi. …”
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