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    Statistical Modeling of Wall Roughness and Its Influence on NLOS VLC Channels in Underground Mining by Sebastian Cornejo, Pablo Palacios Játiva, Cesar Azurdia Meza, Iván Sánchez

    Published 2025-02-01
    “…Simulation scenarios, parameterized with material reflectivity data from ASTM E423, explore the effects of statistical distributions (uniform, normal with <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi>μ</mi></semantics></math></inline-formula> = 0.3, <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi>σ</mi></semantics></math></inline-formula> = 0.2; exponential <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi>λ</mi></semantics></math></inline-formula> = 2; gamma <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi>α</mi></semantics></math></inline-formula> = 0.5, <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi>β</mi></semantics></math></inline-formula> = 0.2) on power distribution, channel impulse response, and reflection coefficients. …”
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