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  1. 1
    Modeling the impacts of heavy charged particles on electrical characteristics of n-MOSFET device structure

    Modeling the impacts of heavy charged particles on electrical characteristics of n-MOSFET device structure by I. Yu. Lovshenko, V. R. Stempitsky, V. T. Shandarovich

    Published 2020-11-01
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  2. 2
    Methodology for calculating of the different estimation errors of observed objects location in the airborne optical-location systems

    Methodology for calculating of the different estimation errors of observed objects location in the airborne optical-location systems by A. S. Solonar, P. A. Khmarski, A. A. Mihalkovki, S. V. Tsuprik

    Published 2019-06-01
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