Showing 1 - 3 results of 3 for search '"semiconductor device reliability"', query time: 0.07s Refine Results
  1. 1
    A Fast Method for Lifetime Estimation of Blue Light-Emitting Diode Chips Based on Nonradiative Recombination Defects

    A Fast Method for Lifetime Estimation of Blue Light-Emitting Diode Chips Based on Nonradiative Recombination Defects by Lin-Wang Xu, Ke-Yuan Qian

    Published 2017-01-01
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  2. 2
    An RC snubber design method to achieve optimized switching noise‐loss trade‐off of cascode GaN HEMTs

    An RC snubber design method to achieve optimized switching noise‐loss trade‐off of cascode GaN HEMTs by Peng Xue, Eckart Hoene, Pooya Davari

    Published 2024-09-01
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  3. 3
    Interface trap charges associated reliability analysis of Si/Ge heterojunction dopingless TFET

    Interface trap charges associated reliability analysis of Si/Ge heterojunction dopingless TFET by Suruchi Sharma, Rikmantra Basu, Baljit Kaur

    Published 2021-08-01
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