Lighting the way forward: The bright future of photonic integrated circuits by M.A. Butt, B. Janaszek, R. Piramidowicz

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Impact of Mn/Co substitution on magnetoelectric and structural properties of ZnO nanostructures thin films by Ángela P. Lanchero, Lina F. Prieto, Heiddy P. Quiroz, Jorge A. Calderón, A. Dussan, F. Mesa

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X-Ray Performance of SiC NPN Radiation Detector by Jing Wang, Leidang Zhou, Liang Chen, Silong Zhang, Fangbao Wang, Tingting Fan, Zhuo Chen, Song Bai, Xiaoping Ouyang

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Dynamics of Entanglement between a Quantum Dot Spin Qubit and a Photon Qubit inside a Semiconductor High-Q Nanocavity by Hubert Pascal Seigneur, Gabriel Gonzalez, Michael Niklaus Leuenberger, Winston Vaughan Schoenfeld

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Novel source/drain contact structure for a-IGZO devices: Oxygen-scavenger-layer metal-interlayer-semiconductor (OSL MIS) approach by Sungjoo Song, Jong-Hyun Kim, Jongyoun Park, Seung-Hwan Kim, Dongjin Ko, Hyejung Choi, Seiyon Kim, Hyun-Yong Yu

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Al‐Rich AlGaN Transistors with Regrown p‐AlGaN Gate Layers and Ohmic Contacts by Brianna Klein, Andrew Allerman, Andrew Armstrong, Mary Rosprim, Colin Tyznik, Yinxuan Zhu, Chandan Joishi, Chris Chae, Siddharth Rajan

Subjects: “…semiconductors…”
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Elastic Properties and the Band Gap of AlNxP1-x Semiconductor Alloy: A Comparative Study of Various Ab Initio Approaches by M. P. Polak, M. J. Winiarski, K. Wittek, P. Scharoch

“…Structural and elastic properties of AlNxP1-x, a novel semiconductor alloy, are studied from the first principles in both zinc-blende and wurtzite structures. …”
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Classification of Silicon (Si) Wafer Material Defects in Semiconductor Choosers using a Deep Learning ShuffleNet-v2-CNN Model by Rajesh Doss, Jayabrabu Ramakrishnan, S. Kavitha, S. Ramkumar, G. Charlyn Pushpa Latha, Kiran Ramaswamy

“…The silicon wafer is one of the raw materials used to make semiconductor chipsets. Semiconductor failure or dysfunction could be the result of defects in the layers of this material. …”
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ANALYSIS OF PHASE AND ELEMENT COMPOSITION OF RAW MATERIALS AND SEMICONDUCTORS OF THE CAST IRON AND STEEL PRODUCTION PROCESS USING ANALYTICAL SYSTEM ARL 9900 WORKSTATION by P. S. Chizhov

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Noncontact Monitoring and Imaging of the Operation and Performance of Thin‐Film Field‐Effect Transistors by Kwangsik Jeong, Dong yeob Shin, Ji‐Min Park, Dong‐Joon Yi, Hyunmin Hong, Hyun‐Suk Kim, Kwun‐Bum Chung

Subjects: “…amorphous oxide semiconductor…”
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Warpage in wafer-level packaging: a review of causes, modelling, and mitigation strategies by Pallavi Praful, Chris Bailey

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Improving the Selectivity of Metal Oxide Semiconductor Sensors for Mustard Gas Simulant 2-Chloroethyl Ethyl Sulfide by Combining the Laminated Structure and Temperature Dynamic Modulation by Yadong Liu, Siyue Zhao, Lijuan You, Yong Xu, Renjun Si, Shunping Zhang

“…Insufficient selectivity is a major constraint to the further development of metal oxide semiconductor (MOS) sensors for chemical warfare agents, and this paper proposed an improved scheme combining catalytic layer/gas-sensitive layer laminated structure with temperature dynamic modulation for the Mustard gas (HD) MOS sensor. …”
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Valence Band Structure of InAs1-xBix and InSb1-xBix Alloy Semiconductors Calculated Using Valence Band Anticrossing Model by D. P. Samajdar, S. Dhar

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Reduced Representation Libraries from DNA Pools Analysed with Next Generation Semiconductor Based-Sequencing to Identify SNPs in Extreme and Divergent Pigs for Back Fat Thickness by Samuele Bovo, Francesca Bertolini, Giuseppina Schiavo, Gianluca Mazzoni, Stefania Dall’Olio, Luca Fontanesi

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A 22% Efficient Semiconductor/Liquid Junction Solar Cell—the Photoelectrochemical Behavior of n-WSe2 Electrodes in the Presence of I2/I- in Aqueous Electrolyte by G. Campet, C. Azaiez, F. Levy, H. Bourezc, J. Claverie

“…One of the most efficient semiconductor/liquid-junction photoelectrochemical cells (PEC) reported to date is presented. …”
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Comparative Study of SiO2, Al2O3, and BeO Ultrathin Interfacial Barrier Layers in Si Metal-Oxide-Semiconductor Devices by J. H. Yum, J. Oh, Todd. W. Hudnall, C. W. Bielawski, G. Bersuker, S. K. Banerjee

“…In this paper, we compare the electrical characteristics of inserting an ultrathin interfacial barrier layer such as SiO2, Al2O3, or BeO between the HfO2 gate dielectric and Si substrate in metal oxide semiconductor capacitors (MOSCAPs) and n-channel inversion type metal oxide semiconductor field effect transistors (MOSFETs). …”
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500 V breakdown voltage in β‐Ga2O3 laterally diffused metal‐oxide‐semiconductor field‐effect transistor with 108 MW/cm2 power figure of merit by Nesa Abedi Rik, Ali. A. Orouji, Dariush Madadi

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Enhanced sensing capabilities of UV–visible p-n and p-i-n photodiodes using unique layer and contact configurations by Ahmed Ali Alarabi, Osman Çiçek, Hasan Makara, Fatih Ünal, Merve Zurnacı, Şemsettin Altındal

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Measuring. Monitoring. Management. Control by V.S. Volkov, S.N. Bazykin, V.A. Bardin, K.S. Samohina, N.V. Volkova

Subjects: “…semiconductor membrane…”

Machine learning assisted prediction with data driven robust optimization: Machining process modeling of hard part turning of DC53 for tooling applications supporting semiconductor manufacturing by Mehdi Tlija, Muhammad Sana, Anamta Khan, Sana Hassan, Muhammad Umar Farooq

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