Showing 441 - 460 results of 685 for search '"semiconductor"', query time: 0.04s Refine Results
  1. 441

    GaN-Based High-k Praseodymium Oxide Gate MISFETs with P2S5/(NH4)2SX + UV Interface Treatment Technology by Chao-Wei Lin, Hsien-Chin Chiu

    Published 2012-01-01
    “…This study examines the praseodymium-oxide- (Pr2O3-) passivated AlGaN/GaN metal-insulator-semiconductor high electron mobility transistors (MIS-HEMTs) with high dielectric constant in which the AlGaN Schottky layers are treated with P2S5/(NH4)2SX + ultraviolet (UV) illumination. …”
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  2. 442

    A high speed processor for elliptic curve cryptography over NIST prime field by Xianghong Hu, Xueming Li, Xin Zheng, Yuan Liu, Xiaoming Xiong

    Published 2022-07-01
    “…On a 55 nm complementary metal oxide semiconductor application specific integrated circuit platform, the processor costs 463k gates and requires 0.028 ms for one SM. …”
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  3. 443

    Photoelectrochemical Stability and Alteration Products of n-Type Single-Crystal ZnO Photoanodes by I. E. Paulauskas, G. E. Jellison, L. A. Boatner, G. M. Brown

    Published 2011-01-01
    “…Current measurements performed at the peak indicate that charging and discharging effects are apparently taking place at the semiconductor/electrolyte interface. This result is consistent with the significant reactive degradation that takes place on the ZnO single crystal photoanode surface and that ultimately leads to the reduction of the ZnO surface to Zn metal. …”
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  4. 444

    Dynamic Modeling of Stress-Induced Defect Expansion in VCSELs by Yuqi Zhang, Xun Li, Jia Zhao

    Published 2024-01-01
    “…Many failures of semiconductor-based oxide confined vertical cavity surface emitting lasers (VCSELs) are closely related to the generation and expansion of defects in the device structure. …”
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  5. 445

    Nanoscaled Electrocatalytic Optically Modulated ZnO Nanoparticles through Green Process of Punica granatum L. and Their Antibacterial Activities by Xolile Fuku, Abdoulaye Diallo, Malik Maaza

    Published 2016-01-01
    “…The optical band gap of ZnO NPs was calculated to be 3.48 eV which indicates that ZnO NPs can be used in metal oxide semiconductor-based devices. Further, the nanomaterials were also found to be good inhibitors of bacterial strains at both low and high concentrations of 5–10 mg mL−1.…”
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  6. 446

    LDDP-Net: A Lightweight Neural Network with Dual Decoding Paths for Defect Segmentation of LED Chips by Jie Zhang, Ning Chen, Mengyuan Li, Yifan Zhang, Xinyu Suo, Rong Li, Jian Liu

    Published 2025-01-01
    “…Chip defect detection is a crucial aspect of the semiconductor production industry, given its significant impact on chip performance. …”
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  7. 447

    Probing and manipulating the Mexican hat-shaped valence band of In2Se3 by James Felton, Jordan Harknett, Joe Page, Zhuo Yang, Nada Alghofaili, James N. O’Shea, Laurence Eaves, Yoshimitsu Kohama, Mark T. Greenaway, Amalia Patanè

    Published 2025-01-01
    “…Abstract Ferroelectrics based on van der Waals semiconductors represent an emergent class of materials for disruptive technologies ranging from neuromorphic computing to low-power electronics. …”
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  8. 448

    The thermoelectric conversion efficiency problem: Insights from the electron gas thermodynamics close to a phase transition by I. Khomchenko, A. Ryzhov, F. Maculewicz, F. Kurth, R. Hühne, A. Golombek, M. Schleberger, C. Goupil, Ph. Lecoeur, A. Böhmer, G. Benenti, G. Schierning, H. Ouerdane

    Published 2025-02-01
    “…By relating the thermoelastic properties of the electronic working fluid to its transport properties (considering noninteracting electron systems), we show why the performance of conventional semiconductor materials is doomed to remain low. Analyzing the temperature dependence of the power factor theoretically in 2D systems and experimentally in a thin film, we find that in the fluctuation regimes of an electronic phase transition, the thermoelectric power factor can significantly increase owing to the increased compressibility of the electron gas. …”
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  9. 449

    Revised direct bandgap and band parameters for AlP: hybrid-functional first-principles calculations vs experiment by Cónal Murphy, Eoin P. O’Reilly, Christopher A. Broderick

    Published 2025-01-01
    “…Despite its relevance to the development of quantum-confined heterostructures for classical and quantum applications, there is significant uncertainty regarding several key band parameters for the indirect-gap III–V semiconductor AlP. Critically, using hybrid-functional first-principles calculations, we find that the Γ6c–Γ8v bandgap is ∼1 eV larger than the widely assumed value of 3.63 eV. …”
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  10. 450

    Boron-doped diamond MOSFETs operating at temperatures up to 400°C by Jiangwei Liu, Tokuyuki Teraji, Bo Da, Yasuo Koide

    Published 2025-12-01
    “…The boron-doped diamond (B-diamond) metal-oxide–semiconductor field–effect transistors (MOSFETs) are fabricated and characterized at operating temperatures up to 400°C. …”
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  11. 451

    Wavelength Tuning Free Transceiver Module in OLT Downstream Multicasting 4λ × 10 Gb/s TWDM-PON System by M. S. Salleh, A. S. M. Supa’at, S. M. Idrus, S. Yaakob, Z. M. Yusof

    Published 2014-01-01
    “…Meanwhile, the fixed wavelength optical line terminal (OLT) transmitter with wavelength tuning free features has been designed to integrate with the semiconductor optical amplifier (SOA) and passive arrayed waveguide grating (AWG). …”
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  12. 452

    A four‐stage yield optimization technique for analog integrated circuits using optimal computing budget allocation and evolutionary algorithms by Abbas Yaseri, Mohammad Hossein Maghami, Mehdi Radmehr

    Published 2022-09-01
    “…The yield value obtained from the simulation results for two‐stage class‐AB Operational Transconductance Amplifer (OTA) in 180 nm Complementary Metal‐Oxide‐Semiconductor (CMOS) technology is 99.85%. The proposed method has less computational effort and high accuracy than the MC‐based approaches. …”
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  13. 453

    The method of non-destructive measurement of power thyristor surge current by G. N. Anisimov, K. K. Kim, A. A. Tkachuk, A. Yu. Kuzmenko

    Published 2023-02-01
    “…The method is based on continuous control at each moment of time of the dynamic capacitance, the changing in the nature of the time dependence of which predicts the destruction of the semiconductor structure.…”
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  14. 454
  15. 455

    The Effect of Ferroelectric/Dielectric Capacitance Ratio on Short-Term Retention Characteristics of MFMIS FeFET by Junghyeon Hwang, Giuk Kim, Hongrae Joh, Jinho Ahn, Sanghun Jeon

    Published 2024-01-01
    “…Metal-ferroelectric-metal-insulator-semiconductor (MFMIS) FeFETs have significant potential for use in non-volatile memory applications. …”
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  16. 456

    Theoretical study of the electronic and optical properties of a composite formed by the zeolite NaA and a magnetite cluster by Joel Antúnez-García, Roberto Núñez-González, Vitalii Petranovskii, H’Linh Hmok, Armando Reyes-Serrato, Fabian N. Murrieta-Rico, Mufei Xiao, Jonathan Zamora

    Published 2025-01-01
    “…It is noteworthy that the composite exhibits magnetic properties of a half-semiconductor and a strong optical response within the visible and ultraviolet regions of the spectrum.…”
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  17. 457

    Strategic Review: The CZTS Thin-Film Using Tandem and Multi-Junction Solar Cell by Saif Adnan Muhamad, Methaq Hadi Lafta

    Published 2022-12-01
    “…The second generation of technology or thin-film technology, based on the semiconductor coating layer on glass, metal, or polymer layers, is 1μm - 5μm thick. …”
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  18. 458

    A 0.002‐mm2 8‐bit 1‐MS/s low‐power time‐based DAC (T‐DAC) by Ali H. Hassan, Hassan Mostafa, Mohamed Refky, Khaled N. Salama, Ahmed M. Soliman

    Published 2021-11-01
    “…Complementary metal oxide semiconductor technology with a 1 V supply voltage, 1 MS/s conversion rate, and 0.9 μW power dissipation.…”
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  19. 459
  20. 460

    Electrochemical Study of Anodized Titanium in Phosphoric Acid by M. Khadiri, M. Elyaagoubi, R. Idouhli, Y. Koumya, O. Zakir, J. Benzakour, A. Benyaich, A. Abouelfida, A. Outzourhit

    Published 2020-01-01
    “…Thus, the Mott Schottky model revealed that the formed film is an n-type semiconductor. The density of charge carriers is in good agreement with those found in the literature. …”
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