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    The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection

    The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection by Dong Dai, Zhenyu Wang, Hao Huang, Xu Mao, Yehong Liu, Hao Li, Du Chen

    Published 2025-07-01
    Subjects: “…microwave localizing method…”
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