Investigating Floating-Gate Topology Influence on van der Waals Memory Performance by Hao Zheng, Yusang Qin, Caifang Gao, Junyi Fang, Yifeng Zou, Mengjiao Li, Jianhua Zhang

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Enhancing the Capacitive Memory Window of HZO FeCap Through Nanolaminate Stack Design by Mostafa Habibi, Alireza Kashir, Seungyeol Oh, Hojung Jang, Hyunsang Hwang

Subjects: “…capacitive memory window…”
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Variability Analysis of Ferroelectric FinFETs for Embedded Non-Volatile Memory Applications by Byeongju Ha, Dongyeong Kim, Taekhan Yoon, Sola Woo

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Gate Engineering Effect in Ferroelectric Field‐Effect Transistors with Al‐Doped HfO2 Thin Film and Amorphous Indium‐Gallium‐Zinc‐Oxide Channel by Jae Hoon Lee, Yonghee Lee, Joon‐Kyu Han, Kyung Do Kim, Seung Ryong Byun, Hyeon Woo Park, Cheol Seong Hwang

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A Compact Model for BEOL-Compatible Ferroelectric Thin Film Transistors With Metal/Ferroelectric/Semiconductor Structure by Wei Zhang, Jianze Wang, Chen Sun, Qiwen Kong, Zhen Wu, Xiao Gong, Xuanyao Fong

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Recent advancements and progress in development of ferroelectric field effect transistor: A review by Mandeep Singh, Nakkina Sai Teja, Tarun Chaudhary, Balwinder Raj

Subjects: “…Thin profile polarisation memory window data retention endurance…”
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