New materials — primary converters of semiconductor measuring cells based on InAs-CdTe system by I. A. Kirovskaya, E. N. Kopylova, E. V. Mironova, A. O. Ekkert, R. V. Ekkert, O. V. Kropotin, V. I. Krasheninin, Yu. I. Matyash

Subjects: “…interconnected patterns of changes of the studied properties…”
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