Showing 1 - 3 results of 3 for search '"integrated circuit testing"', query time: 0.03s Refine Results
  1. 1
    Noise‐based logic locking scheme against signal probability skew analysis

    Noise‐based logic locking scheme against signal probability skew analysis by Ahmad Rezaei, Ali Mahani

    Published 2021-07-01
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  2. 2
    New scan compression approach to reduce the test data volume

    New scan compression approach to reduce the test data volume by Pralhadrao V. Shantagiri, Rohit Kapur, Chandrasekar Shastry

    Published 2021-07-01
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  3. 3
    All‐digital built‐in self‐test scheme for charge‐pump phase‐locked loops

    All‐digital built‐in self‐test scheme for charge‐pump phase‐locked loops by Lanhua Xia, Jifei Tang

    Published 2021-01-01
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