X-ray diffraction study of structure of CaO-Al2O3-SiO2 ternary compounds in molten and crystalline states by Sokol’skii V.E., Pruttskov D.V., Yakovenko O.M., Kazimirov V.P., Roik O.S., Golovataya N.V., Sokolsky G.V.

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X-ray diffraction and SEM/EDX studies on technological evolution of the oxide-fluoride ceramic flux for submerged arc-surfacing by Sokolsky V.E., Roik A.S., Davidenko A.V., Kazimirov V.P., Lisnyak V.V., Galinich V.I., Goncharov I.A.

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