-
1
Wafer Defect Classification Algorithm With Label Embedding Using Contrastive Learning
Published 2025-01-01Subjects: Get full text
Article -
2
Adaptive Ensemble Learning Model-Based Binary White Shark Optimizer for Software Defect Classification
Published 2025-01-01Subjects: Get full text
Article -
3
Defects in castings during high‑pressure casting and measures to prevent their formation
Published 2024-04-01Subjects: Get full text
Article