ANALYSIS OF SURFACE DEFECTS OF ALUMINUM AND ITS ALLOYS WITH A SCANNING KELVIN PROBE by A. K. Tyavlovsky, A. L. Zharin, O. K. Gusev, R. I. Varabei, N. I. Muhurov, G. V. Sharonov, K. U. Pantsialeyeu

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DESIGN OF THE CONTACT POTENTIALS DIFFERENCE PROBES by K. U. Pantsialeyeu, U. A. Mikitsevich, A. L. Zharin

Subjects: “…contact potential difference…”
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KELVIN PROBE’S STRAY CAPACITANCE AND NOISE SIMULATION by S. Danyluk, A. V. Dubanevich, O. K. Gusev, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, R. I. Vorobey, A. L. Zharin

Subjects: “…contact potential difference…”
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METHODS FOR LOCAL CHANGES IN THE PLASTIC DEFORMATION DIAGNOSTICS ON THE WORK FUNCTION by K. V. Panteleyev, A. I. Svistun, A. L. Zharin

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Electron work function in individual multiwalled carbon nanotubes doped with nitrogen and boron by N. A. Davletkildeev, D. V. Sokolov, E. Yu. Mosur, I. A. Lobov

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DIGITAL CONTACT POTENTIAL DIFFERENCE PROBE by K. U. Pantsialeyeu, A. I. Svistun, A. K. Tyavlovsky, A. L. Zharin

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Universal Digital Probe Electrometer for Testing Semiconductor Wafers by A. L. Zharin, U. A. Mikitsevich, A. I. Svistun, K. U. Pantsialeyeu

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