Contrastive Learning with Global and Local Representation for Mixed-Type Wafer Defect Recognition by Shantong Yin, Yangkun Zhang, Rui Wang

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QTL analysis for plant height and fine mapping of two environmentally stable QTLs with major effects in soybean by Yu TIAN, Lei YANG, Hong-feng LU, Bo ZHANG, Yan-fei LI, Chen LIU, Tian-li GE, Yu-lin LIU, Jia-nan HAN, Ying-hui LI, Li-juan QIU

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Construction of high-density bin genetic map and QTL mapping of fruit aroma in longan (Dimocarpus longan Lour.) by Wenshun Hu, Qing Zhang, Chaojun Deng, Qizhi Xu, Jimou Jiang, Xiuping Chen, Jianguo Li, Jisen Zhang, Shaoquan Zheng

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Mapping and identification of QTLs for low light tolerance traits in grapevine by Xiaohao Ji, Meng Shi, Fengzhi Liu, Xiaodi Wang, Zhiqiang Wang, Haibo Wang

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Semi-Supervised Learning With Wafer-Specific Augmentations for Wafer Defect Classification by Uk Jo, Seoung Bum Kim

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