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    Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components

    Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components by João Valdoleiros, Alireza Akhavan-Safar, Payam Maleki, Pedro F. C. Videira, Ricardo J. C. Carbas, Eduardo A. S. Marques, Bala Karunamurthy, Lucas F. M. da Silva

    Published 2025-01-01
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