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1
Impulse Shaping Method Based on Bayesian Deconvolution
Published 2025-04-01Subjects: “…bayesian deconvolution…”
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2
Demonstration of Gate-Related Trap Characterization in 4H-SiC MOSFETs Using Gate Stress Leakage Current
Published 2025-01-01Subjects: “…Bayesian deconvolution…”
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Article