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  1. 1
    AFM Calculated Parameters of Morphology Investigation of Spin Coated MZO (M = Al, Sn, Cd, Co) Layers

    AFM Calculated Parameters of Morphology Investigation of Spin Coated MZO (M = Al, Sn, Cd, Co) Layers by M. Benhaliliba, A. Tiburcio-Silver, A. Avila-Garcia

    Published 2015-12-01
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  2. 2
    Correlation Between Quantum Confinement Effect and Characteristics of Thin-Film Transistors in Solution-Processed Oxide-Based Thin-Films

    Correlation Between Quantum Confinement Effect and Characteristics of Thin-Film Transistors in Solution-Processed Oxide-Based Thin-Films by Jinyeong Lee, Jaewook Jeong

    Published 2024-01-01
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