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    An Effective Method to Compensate for Testing Induced SBFET Degradation by Charging Deep-Level Interface Trap

    An Effective Method to Compensate for Testing Induced SBFET Degradation by Charging Deep-Level Interface Trap by Tiexin Zhang, Fanyu Liu, Lei Shu, Siyuan Chen, Yuchong Wang, Yuchen Wu, Jing Wan, Yong Xu, Shi Li, Yuyang Ding, Bo Li, Zhengsheng Han, Tianchun Ye

    Published 2025-01-01
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