Researching on insulator defect recognition based on context cluster CenterNet++ by Bo Meng

Subjects: “…Insulator defect recognition…”
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Image-based anomaly detection in low-light industrial environments with feature enhancement by Dinh-Cuong Hoang, Phan Xuan Tan, Anh-Nhat Nguyen, Son-Anh Bui, Ta Huu Anh Duong, Tuan-Minh Huynh, Duc-Manh Nguyen, Viet-Anh Trinh, Quang-Huy Ha, Nguyen Dinh Bao Long, Duc-Thanh Tran, Xuan-Tung Dinh, Van-Hiep Duong, Tran Thi Thuy Trang

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Automated Defect Detection through Flaw Grading in Non-Destructive Testing Digital X-ray Radiography by Bata Hena, Gabriel Ramos, Clemente Ibarra-Castanedo, Xavier Maldague

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