PBX micro defect characterization by using deep learning and image processing of micro CT images by Liang-liang Lv, Wei-bin Zhang, Xiao-dong Pan, Gong-ping Li, Cui Zhang

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Probing the Impact of Ionic Liquid Additives at the Buried NiOx/Perovskite Interfaces to Understand Solar Cell Performance by Juan Tirado, Mriganka Singh, Michel De Keersmaecker, Erin L. Ratcliff

Subjects: “…defect characterization…”
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Near-field microwave imaging and quantitative characterization of defects in PE pipeline by Mingshi LUO, Mengmeng ZHANG, Yang FANG

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Defect Density of States of Tin Oxide and Copper Oxide p‐type Thin‐film Transistors by Måns J. Mattsson, Kham M. Niang, Jared Parker, David J. Meeth, John F. Wager, Andrew J. Flewitt, Matt W. Graham

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A method and apparatus for characterizing defects in large flat composite structures by Line Scan Thermography and neural network techniques by Arsenii Chulkov, Vladimir Vavilov, Denis Nesteruk, Douglas Burleigh, Alexey Moskovchenko

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Additive manufacturing of continuous fiber composite curved thin-walled structures with conformal honeycomb-stiffeners based on topology optimization by Yang Chen, Shikai Jing, Chunzu Liang, Zihao Wang, Fengjiao Bin, Xiangxiao Bu, Jinlong Zhang, Zhiping Ling, Xianda Wang, Ruixiong Zhang, Wei Li, Dengbao Xiao

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