Showing 1 - 1 results of 1 for search '"DRAM (Dynamic Random Access Memory)"', query time: 0.04s Refine Results
  1. 1
    Mitigating Pass Gate Effect in Buried Channel Array Transistors Through Buried Oxide Integration: Addressing Interference Phenomenon Between Word Lines

    Mitigating Pass Gate Effect in Buried Channel Array Transistors Through Buried Oxide Integration: Addressing Interference Phenomenon Between Word Lines by Yeongmyeong Cho, Yeon-Seok Kim, Min-Woo Kwon

    Published 2024-11-01
    Subjects:
    Get full text
    Article
    Save to List
    Saved in:

Search Tools: