STUDY OF MAGNETOSTRICTIVE PROPERTIES OF MATERIALS BY MEANS OF METHOD OF ATOMIC FORCE MICROSCOPY by D. A. Stepanenko, K. A. Bogdanchuk, V. T. Minchenya, T. A. Kuznetsova

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EQUIPMENT FOR NONDESTRUCTIVE TESTING OF SILICON WAFERS SUBMICRON TOPOLOGY DURING THE FABRICATION OF INTEGRATED CIRCUITS by S. A. Chizhik, S. P. Basalaev, V. A. Pilipenko, A. L. Khudoley, T. A. Kuznetsova, V. V. Chikunov, A. A. Suslov

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Determination of microstructural changes by severely plastically deformed copper-aluminum alloy: Optical study by Romčević N., Gilić M., Anžel I., Rudolf R., Mitrić M., Romčević M., Hadžić B., Joksimović D., Petrović-Damjanović M., Kos M.

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Visualisation of the interaction between Acidithiobacillus ferrooxidans and oil shale by atomic force microscopy by Milić Jelena S., Beškoski Vladimir P., Ranđelović Danijela V., Stojanović Jelica, Vrvić Miroslav M.

Subjects: “…atomic force microscopy…”
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Nanoindentation analysis of transcrystalline layers in model carbon fiber-reinforced PEEK composite by Sophie Vanpée, Bernard Nysten, Jérémy Chevalier, Thomas Pardoen

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Advanced atomic force microscopy techniques V by Philipp Rahe, Ilko Bald, Nadine Hauptmann, Regina Hoffmann-Vogel, Harry Mönig, Michael Reichling

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Cisplatin resistance alters ovarian cancer spheroid formation and impacts peritoneal invasion by Lydia C. Powell, Marcos Quintela, David W. James, Emenike Onyido, David Howard, Kadie Edwards, Jordan L. Turney, Charlotte R. Morgan, Jenny Worthington, Nicole Williams, Alexander Dulebo, Heiko Haschke, Deyarina Gonzalez, R. Steven Conlan, Lewis W. Francis

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Micromechanical Characterization of Diatom Frustules of Multiple Origin by Daniel Zuluaga-Astudillo, Juan Carlos Ruge, Bernardo Caicedo-Hormaza

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Study of charge transfer process in system of «hemoglobin-electrode» at level of individual molecules by N. A. Davletkildeev, D. V. Sokolov, E. A. Zimbovich, E. Yu. Mosur, I. A. Lobov

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Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy by N. A. Davletkildeev, E. Yu. Mosur, D. V. Sokolov, I. A. Lobov

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Research progress on the structure of hydration films at solid–liquid interfaces by Na ZHANG, Jue KOU, Chunbao SUN

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Determination of Crack Resistance of the Cover and Slide Glass by Indentation Method with the Visualization Using Atomic Force Microscopy by V. A. Lapitskaya, T. A. Kuznetsova, S. A. Chizhik

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The effect of synthesis time on morphology and electronic structure of polyaniline by I. A. Lobov, I. K. Shulus

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Formation on quartz substrate and study of properties of nanostructured layers from polyvinylen obtained by dehydrochlorination of polyvinyl chloride with modifying additive — iron... by O. V. Krivozubov, Yu. G. Kryazhev, I. V. Anikeeva, N. A. Davletkildeev, D. V. Sokolov, O. N. Semenova

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Neurotoxic Effect of Myricitrin in Copper-Induced Oxidative Stress Is Mediated by Increased Intracellular Ca²⁺ Levels and ROS/p53/p38 Axis by Ignacija Vlašić, Antonio Krstačić-Galić, Anđela Horvat, Nada Oršolić, Anja Sadžak, Lucija Mandić, Suzana Šegota, Maja Jazvinšćak Jembrek

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CellMAP: an open-source software tool to batch-process cell topography and stiffness maps collected with an atomic force microscope by Antoine Allard, Maxime Liboz, Raphaël Crépin, Sid Labdi, Olek Maciejak, Michel Malo, Clément Campillo, Guillaume Lamour

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Probe‐Based Mechanical Data Storage on Polymers Made by Inverse Vulcanization by Abigail K. Mann, Samuel J. Tonkin, Pankaj Sharma, Christopher T. Gibson, Justin M. Chalker

Subjects: “…atomic force microscopy…”
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Crack resistance of carbonized layer of multilayer polyurethane with nanofillers. Combination of casting, solution, carbonization by ion implantation technologies by R. I. Izyumov, A. L. Svistkov, V. S. Chudinov, I. V. Osorgina, A. G. Pelevin

Subjects: “…digital optical and atomic force microscopy…”
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Comprehensive characterization of tobacco-induced changes in enamel surface topography by Tamanna Kaur, Ramya Ramadoss, Nitya Krishnasamy, Sandhya Sundar, Suganya Panneer Selvam, Hema Shree K

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Humidity-controlled interactions and lifting of MoS2 on SiO2 by Sebastiaan Haartsen, Jantinus Wisman, Harold J W Zandvliet, Pantelis Bampoulis

Subjects: “…atomic force microscopy…”
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