Showing 101 - 120 results of 252 for search '"Приборы и методы измерений"', query time: 0.04s Refine Results
  1. 101
    TECHNIQUE OF ESTIMATION OF ERROR IN THE REFERENCE VALUE OF THE DOSE DURING THE LINEAR ACCELERATOR RADIATION OUTPUT CALIBRATION PROCEDURE. PART 1. DEPENDANCE OF THE MECHANICAL PARAMETERS OF LINAC’S GANTRY

    TECHNIQUE OF ESTIMATION OF ERROR IN THE REFERENCE VALUE OF THE DOSE DURING THE LINEAR ACCELERATOR RADIATION OUTPUT CALIBRATION PROCEDURE. PART 1. DEPENDANCE OF THE MECHANICAL PARAM... by Y. V. Tsitovich, M. G. Kiselev

    Published 2015-12-01
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  2. 102
    THE ENSURING FUNCTIONAL INTERCHANGEABILITY WHEN FORMING THE CONTROL COMPLEX OF INDICATORS OF THE INITIAL CONDITION OF THE CONSUMER OF SPORTS AND IMPROVING SERVICES

    THE ENSURING FUNCTIONAL INTERCHANGEABILITY WHEN FORMING THE CONTROL COMPLEX OF INDICATORS OF THE INITIAL CONDITION OF THE CONSUMER OF SPORTS AND IMPROVING SERVICES by A. S. Khorloohiyn, P. S. Serenkov, V. M. Romanchack

    Published 2017-09-01
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  3. 103
    CALCULATION OF STATIC PARAMETERS OF SILICON DIODE CONTAINING δ-LAYER OF TRIPLE-CHARGED POINT DEFECTS IN SYMMETRIC p–n-JUNCTION

    CALCULATION OF STATIC PARAMETERS OF SILICON DIODE CONTAINING δ-LAYER OF TRIPLE-CHARGED POINT DEFECTS IN SYMMETRIC p–n-JUNCTION by N. A. Poklonski, A. I. Kovalev, N. I. Gorbachuk, S. V. Shpakovski

    Published 2018-06-01
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  4. 104
    INVESTIGATION OF ASYNCHRONOUS OPTICAL COMMUNICATION CHANNEL THROUGHPUT CONTAINING A RECEIVER ON THE BASIS OF PHOTON COUNTER

    INVESTIGATION OF ASYNCHRONOUS OPTICAL COMMUNICATION CHANNEL THROUGHPUT CONTAINING A RECEIVER ON THE BASIS OF PHOTON COUNTER by I. R. Gulakov, A. O. Zenevich, A. M. Timofeev, A. G. Кosari

    Published 2015-03-01
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  5. 105
    Calculation of Correction Factors for Vickers’ Hardness Measurements on a Non-Planar Surface

    Calculation of Correction Factors for Vickers’ Hardness Measurements on a Non-Planar Surface by S. G. Sandomirski, A. L. Val’ko, S. P. Rudenko

    Published 2022-10-01
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  6. 106
    High-Frequency Capacitor with Working Substance "Insulator-Undoped Silicon-Insulator"

    High-Frequency Capacitor with Working Substance "Insulator-Undoped Silicon-Insulator" by N. A. Poklonski, I. I. Anikeev, S. A. Vyrko

    Published 2022-12-01
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  7. 107
    PERFECTION OF ACTIVITY OF MEASURING (TESTING) LABORATORIES WITH THE USE OF KNOWLEDGE MANAGEMENT SYSTEMS

    PERFECTION OF ACTIVITY OF MEASURING (TESTING) LABORATORIES WITH THE USE OF KNOWLEDGE MANAGEMENT SYSTEMS by K. A. Pavlov, P. S. Serenkov, V. A. Nifagin

    Published 2015-04-01
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  8. 108
    LOW NOISE ELECTRONICS MODULE FOR AVALANCHE PHOTODIODE SIGNAL READOUT

    LOW NOISE ELECTRONICS MODULE FOR AVALANCHE PHOTODIODE SIGNAL READOUT by O. V. Dvornikov, V. A. Tchekhovski, V. L. Diatlov, N. N. Prokopenko

    Published 2015-03-01
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  9. 109
    METROLOGICAL SUPPORT OF DOSIMETRY GAMMA-RAY WITH ENERGY TO 10 MEV FOR RADIATION PROTECTION DEVICES

    METROLOGICAL SUPPORT OF DOSIMETRY GAMMA-RAY WITH ENERGY TO 10 MEV FOR RADIATION PROTECTION DEVICES by D. I. Komar, R. V. Lukashevich, V. D. Guzov, S. A. Kutsen

    Published 2017-09-01
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  10. 110
    ANALYSIS OF SURFACE DEFECTS OF ALUMINUM AND ITS ALLOYS WITH A SCANNING KELVIN PROBE

    ANALYSIS OF SURFACE DEFECTS OF ALUMINUM AND ITS ALLOYS WITH A SCANNING KELVIN PROBE by A. K. Tyavlovsky, A. L. Zharin, O. K. Gusev, R. I. Varabei, N. I. Muhurov, G. V. Sharonov, K. U. Pantsialeyeu

    Published 2017-02-01
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  11. 111
    TECHNIQUE OF ESTIMATE OF ABSORPTION COEFFICIENT LASER RADIATION IN BORON DOPED DIAMONDS BY INTENSITY OF RAMAN SCATTERING

    TECHNIQUE OF ESTIMATE OF ABSORPTION COEFFICIENT LASER RADIATION IN BORON DOPED DIAMONDS BY INTENSITY OF RAMAN SCATTERING by O. N. Poklonskaya

    Published 2015-03-01
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  12. 112
    Non-Additive Quantity Measurement Model

    Non-Additive Quantity Measurement Model by V. M. Romanchak, P. S. Serenkov

    Published 2022-10-01
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  13. 113
    QUANTUM INTERFEROMETER FOR LIMITED MEASUREMENTS

    QUANTUM INTERFEROMETER FOR LIMITED MEASUREMENTS by I. E. Zuikov

    Published 2015-04-01
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  14. 114
    FAST METHOD OF NON-CONTACT MICROWAVE MEASUREMENTS OF ELECTRICAL PARAMETERS OF COMPACT SAMPLES

    FAST METHOD OF NON-CONTACT MICROWAVE MEASUREMENTS OF ELECTRICAL PARAMETERS OF COMPACT SAMPLES by N. A. Poklonski, A. I. Siahlo, V. T. Shnitko, V. A. Merkulov, O. M. Davidenia, A. I. Kovalev

    Published 2015-03-01
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  15. 115
    Low Dose Rate X-Ray Radiation Fields Implementation for Study of Energy Response of the Dosimeters Based on Scintillation Detectors

    Low Dose Rate X-Ray Radiation Fields Implementation for Study of Energy Response of the Dosimeters Based on Scintillation Detectors by A. V. Novichenko, R. V. Lukashevich, K. G. Senkovsky

    Published 2019-06-01
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  16. 116
    Control of local stress in semiconductor silicon structures

    Control of local stress in semiconductor silicon structures by S. F. Sianko, V. A. Zelenin

    Published 2018-09-01
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  17. 117
    METHOD OF THE VIBRATING DIAGNOSTICS OF DEFFECTS OF ELASTIC DESIGNS ON THE BASIS OF THE ANALYSIS OWN FORMS OF FLUCTUATIONS

    METHOD OF THE VIBRATING DIAGNOSTICS OF DEFFECTS OF ELASTIC DESIGNS ON THE BASIS OF THE ANALYSIS OWN FORMS OF FLUCTUATIONS by A. V. Kositsyn

    Published 2015-04-01
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  18. 118
    Features of the Surface and Subsurface Waves Application for Ultrasonic Evaluation of Physicomechanical Properties of Solids. Part 2. Strenghtned Inhomogeneous Surface Layer

    Features of the Surface and Subsurface Waves Application for Ultrasonic Evaluation of Physicomechanical Properties of Solids. Part 2. Strenghtned Inhomogeneous Surface Layer by A. R. Baev, A. L Mayorov, N. V. Levkovich, M. V. Asadchaya

    Published 2019-03-01
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  19. 119
    Lens Raster as a Source of Distortions in Integral Photography

    Lens Raster as a Source of Distortions in Integral Photography by E. G. Zaytseva, A. A. Kisliuk, T. O. Laryonova, N. N. Dubina

    Published 2018-12-01
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  20. 120
    PROGRAM AND APPARATUS UNIT FOR MONITORING OF CARDIOVASCULAR SYSTEM BASED ON TONOMETRY

    PROGRAM AND APPARATUS UNIT FOR MONITORING OF CARDIOVASCULAR SYSTEM BASED ON TONOMETRY by S. V. Shilko, V. V. Shevtsov

    Published 2015-04-01
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