Showing 61 - 80 results of 252 for search '"Приборы и методы измерений"', query time: 0.06s Refine Results
  1. 61
    Optimization of the Emitting Coil of a Hardware-Software Complex for Study of Low-Frequency Electromagnetic Radiation’s Shielding Effectiveness

    Optimization of the Emitting Coil of a Hardware-Software Complex for Study of Low-Frequency Electromagnetic Radiation’s Shielding Effectiveness by O. D. Kanafyev, A. V. Trukhanov, T. I. Zubar, S. A. Chizhik, S. S. Grabchikov

    Published 2021-03-01
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  2. 62
    Angular Photometry of Biological Tissue by Ellipsoidal Reflector Method

    Angular Photometry of Biological Tissue by Ellipsoidal Reflector Method by M. A. Bezuglyi, N. V. Bezuglaya, A. V. Ventsuryk, K. P. Vonsevych

    Published 2019-06-01
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  3. 63
    MEASUREMENT OF SPATIAL DISTRIBUTION OF MECHANICAL STRESSES IN ULTRASONIC WAVEGUIDE SYSTEMS BY MEANS OF SENSORS BASED ON VILLARI EFFECT

    MEASUREMENT OF SPATIAL DISTRIBUTION OF MECHANICAL STRESSES IN ULTRASONIC WAVEGUIDE SYSTEMS BY MEANS OF SENSORS BASED ON VILLARI EFFECT by D. A. Stepanenko, K. A. Bogdanchuk, V. T. Minchenya

    Published 2015-03-01
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  4. 64
    APPLICATION OF THE SPECTROMETRIC METHOD FOR CALCULATING THE DOSE RATE FOR CREATING CALIBRATION HIGHLY SENSITIVE INSTRUMENTS BASED ON SCINTILLATION DETECTION UNITS

    APPLICATION OF THE SPECTROMETRIC METHOD FOR CALCULATING THE DOSE RATE FOR CREATING CALIBRATION HIGHLY SENSITIVE INSTRUMENTS BASED ON SCINTILLATION DETECTION UNITS by R. V. Lukashevich, G. A. Fokov

    Published 2017-09-01
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  5. 65
    COMPENSATION OF MEASUREMENT ERRORS WHEN REDUCING LINEAR DIMENSIONS OF THE KELVIN PROBE

    COMPENSATION OF MEASUREMENT ERRORS WHEN REDUCING LINEAR DIMENSIONS OF THE KELVIN PROBE by A. K. Tyavlovsky, A. L. Zharin

    Published 2015-03-01
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  6. 66
    STUDY OF USING CANON 1000D DIGITAL CAMERA FOR MULTIZONE PHOTOGRAPHY WITH SPATIALLY-RESOLVED SPECTRAL DEVICES

    STUDY OF USING CANON 1000D DIGITAL CAMERA FOR MULTIZONE PHOTOGRAPHY WITH SPATIALLY-RESOLVED SPECTRAL DEVICES by K. N. Kaplevskiy, M. P. Samtsov, I. M. Gulis, D. S. Tarasov

    Published 2015-03-01
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  7. 67
    COMPLEX FOR ELEMENTAL ANALYSIS OF SUBSURFACE LAYERS WITH NANOMETER DEPTH RESOLUTION

    COMPLEX FOR ELEMENTAL ANALYSIS OF SUBSURFACE LAYERS WITH NANOMETER DEPTH RESOLUTION by A. S. Kamyshan, F. F. Komarov, V. V. Danilevich, P. A. Grishan

    Published 2015-04-01
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  8. 68
    Intelligent Sensor for Measurement Systems with Sinusoidal Excitation Response

    Intelligent Sensor for Measurement Systems with Sinusoidal Excitation Response by U. A. Mikitsevich, A. I. Svistun, A. V. Samarina, K. U. Pantsialeyeu, A. L. Zharin

    Published 2023-04-01
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  9. 69
    THE MULTIFUNCTION MEASURING CONVERTER FOR MONITORING OF LIQUID TECHNOLOGICAL MEDIA

    THE MULTIFUNCTION MEASURING CONVERTER FOR MONITORING OF LIQUID TECHNOLOGICAL MEDIA by R. I. Vorobey, O. K. Gusev, A. L. Zharin, Yu. G. Kuzminsky, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, S. V. Shilko

    Published 2015-04-01
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  10. 70
    CONSIDERATION OF THE DESTABILIZING FACTORS INFLUENCE FOR INCREASING OF THE MEASUREMENTS ACCURACY OF A RANGEFINDER BASED ON STEREO IMAGES

    CONSIDERATION OF THE DESTABILIZING FACTORS INFLUENCE FOR INCREASING OF THE MEASUREMENTS ACCURACY OF A RANGEFINDER BASED ON STEREO IMAGES by V. L. Kozlov

    Published 2017-09-01
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  11. 71
    EQUIPMENT FOR NONDESTRUCTIVE TESTING OF SILICON WAFERS SUBMICRON TOPOLOGY DURING THE FABRICATION OF INTEGRATED CIRCUITS

    EQUIPMENT FOR NONDESTRUCTIVE TESTING OF SILICON WAFERS SUBMICRON TOPOLOGY DURING THE FABRICATION OF INTEGRATED CIRCUITS by S. A. Chizhik, S. P. Basalaev, V. A. Pilipenko, A. L. Khudoley, T. A. Kuznetsova, V. V. Chikunov, A. A. Suslov

    Published 2015-03-01
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  12. 72
    SCANNING PROBE TECHNIQUES IN MICRO- AND NANOMECHANICS

    SCANNING PROBE TECHNIQUES IN MICRO- AND NANOMECHANICS by S. A. Chizhik, S. V. Siroezhlin

    Published 2015-04-01
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  13. 73
    DIAGNOSTICS OF THE HIGH-TORQUE ELECTRICAL MOTOR UNDER OPERATING CONDITIONS AT LOW TEMPERATURES IN VACUUM

    DIAGNOSTICS OF THE HIGH-TORQUE ELECTRICAL MOTOR UNDER OPERATING CONDITIONS AT LOW TEMPERATURES IN VACUUM by A. V. Byeli, A. N. Karpovich, E. G. Bilenko

    Published 2015-04-01
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  14. 74
    HIGH-EFFICIENCY INFRARED RECEIVER

    HIGH-EFFICIENCY INFRARED RECEIVER by A. K. Esman, V. I. Kostenko, N. I. Mukhurov, G. L. Zykov, V. A. Potachits

    Published 2016-09-01
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  15. 75
    THE TWO PARAMETER SENSORS OF THE LIQUID LEVEL

    THE TWO PARAMETER SENSORS OF THE LIQUID LEVEL by A. A. Jezhora, V. V. Rubanik

    Published 2015-04-01
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  16. 76
    Analysis of Illumination Generated by LED Matrices Distribution

    Analysis of Illumination Generated by LED Matrices Distribution by P. S. Bogdan, E. G. Zaytseva, P. O. Baranov, A. I. Stepanenko

    Published 2022-04-01
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  17. 77
    Application of the electron backscateered diffraction method in microstructure research for determining of causes of metal structures destruction

    Application of the electron backscateered diffraction method in microstructure research for determining of causes of metal structures destruction by L. V. Markova, V. V. Koleda, N. S. Kolodinskaya

    Published 2018-09-01
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  18. 78
    THE COLORIMETRY WITH A HIGH DIMENSIONAL RESOLUTION

    THE COLORIMETRY WITH A HIGH DIMENSIONAL RESOLUTION by I. E. Zuikov, E. N. Savkova

    Published 2015-03-01
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  19. 79
    STUDY OF SILICON-INSULATOR STRUCTURE DEFECTS BASED ON ANALYSIS OF A SPATIAL DISTRIBUTION OF A SEMICONDUCTOR WAFERS’ SURFACE POTENTIAL

    STUDY OF SILICON-INSULATOR STRUCTURE DEFECTS BASED ON ANALYSIS OF A SPATIAL DISTRIBUTION OF A SEMICONDUCTOR WAFERS’ SURFACE POTENTIAL by R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky, K. L. Tyavlovsky

    Published 2015-03-01
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  20. 80
    EQUIPMENTS TO SINGLE PHOTON REGISTRATION. PART 1. FEATURES AND POSSIBILITIES OF MULTI-CHANNEL PHOTODETECTORS WITH INTRINSIC AMPLIFICATION. (REVIEW)

    EQUIPMENTS TO SINGLE PHOTON REGISTRATION. PART 1. FEATURES AND POSSIBILITIES OF MULTI-CHANNEL PHOTODETECTORS WITH INTRINSIC AMPLIFICATION. (REVIEW) by O. V. Dvornikov, V. A. Tchekhovski, V. L. Diatlov

    Published 2015-04-01
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