Extending measurement range for three-dimensional structured light imaging with digital exponential fringe pattern
In this paper, a method and an approach for intrinsically extending the measurement range for digital fringe projection profilometry with structured light imaging techniques is presented. This approach exploits the fact that at low levels of defocusing, exponential binary-coded fringe pattern exhibi...
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| Main Author: | |
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| Format: | Article |
| Language: | en_US |
| Published: |
The 2nd Annual Higher Education Conference, Hotel Africana Kampala, Uganda
2020
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| Subjects: | |
| Online Access: | http://hdl.handle.net/20.500.12493/425 |
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