Extending measurement range for three-dimensional structured light imaging with digital exponential fringe pattern
In this paper, a method and an approach for intrinsically extending the measurement range for digital fringe projection profilometry with structured light imaging techniques is presented. This approach exploits the fact that at low levels of defocusing, exponential binary-coded fringe pattern exhibi...
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| Format: | Article |
| Language: | en_US |
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The 2nd Annual Higher Education Conference, Hotel Africana Kampala, Uganda
2020
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| Online Access: | http://hdl.handle.net/20.500.12493/425 |
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| author | Abel, Kamagara |
| author_facet | Abel, Kamagara |
| author_sort | Abel, Kamagara |
| collection | KAB-DR |
| description | In this paper, a method and an approach for intrinsically extending the measurement range for digital fringe projection profilometry with structured light imaging techniques is presented. This approach exploits the fact that at low levels of defocusing, exponential binary-coded fringe pattern exhibits a quasi-sinusoidal form having intact binary structures with reduced or negligible errors owing to high-order harmonic robustness during fringe generation. Experimental simulations and results show that within the desired region of defocus or at an extended measurement range, the proposed method exhibits a 45% comparative reduction in root-mean-square phase error hence improvement in final measurement result. |
| format | Article |
| id | oai:idr.kab.ac.ug:20.500.12493-425 |
| institution | KAB-DR |
| language | en_US |
| publishDate | 2020 |
| publisher | The 2nd Annual Higher Education Conference, Hotel Africana Kampala, Uganda |
| record_format | dspace |
| spelling | oai:idr.kab.ac.ug:20.500.12493-4252024-01-17T04:48:13Z Extending measurement range for three-dimensional structured light imaging with digital exponential fringe pattern Abel, Kamagara Digital structured-light, 3D Measurement; Phase measurement profilometry In this paper, a method and an approach for intrinsically extending the measurement range for digital fringe projection profilometry with structured light imaging techniques is presented. This approach exploits the fact that at low levels of defocusing, exponential binary-coded fringe pattern exhibits a quasi-sinusoidal form having intact binary structures with reduced or negligible errors owing to high-order harmonic robustness during fringe generation. Experimental simulations and results show that within the desired region of defocus or at an extended measurement range, the proposed method exhibits a 45% comparative reduction in root-mean-square phase error hence improvement in final measurement result. Kabale University 2020-07-06T09:14:56Z 2020-07-06T09:14:56Z 2020 Article http://hdl.handle.net/20.500.12493/425 en_US application/pdf The 2nd Annual Higher Education Conference, Hotel Africana Kampala, Uganda |
| spellingShingle | Digital structured-light, 3D Measurement; Phase measurement profilometry Abel, Kamagara Extending measurement range for three-dimensional structured light imaging with digital exponential fringe pattern |
| title | Extending measurement range for three-dimensional structured light imaging with digital exponential fringe pattern |
| title_full | Extending measurement range for three-dimensional structured light imaging with digital exponential fringe pattern |
| title_fullStr | Extending measurement range for three-dimensional structured light imaging with digital exponential fringe pattern |
| title_full_unstemmed | Extending measurement range for three-dimensional structured light imaging with digital exponential fringe pattern |
| title_short | Extending measurement range for three-dimensional structured light imaging with digital exponential fringe pattern |
| title_sort | extending measurement range for three dimensional structured light imaging with digital exponential fringe pattern |
| topic | Digital structured-light, 3D Measurement; Phase measurement profilometry |
| url | http://hdl.handle.net/20.500.12493/425 |
| work_keys_str_mv | AT abelkamagara extendingmeasurementrangeforthreedimensionalstructuredlightimagingwithdigitalexponentialfringepattern |