The effect of the substrate on KF post deposition treatments of narrow gap Cu(In,Ga)Se2 absorber layers
Alkali post deposition treatments (PDT) are the standard method to increase the efficiency of Cu(In,Ga)Se _2 solar cells. In this study, the effects of potassium fluoride (KF) PDTs on narrow band gap Cu(In, Ga)Se _2 (CIS) layers are investigated. The CIS layers were grown on substrates such as glass...
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IOP Publishing
2025-01-01
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| Series: | JPhys Energy |
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| Online Access: | https://doi.org/10.1088/2515-7655/adeae6 |
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| author | Jessica de Wild Guy Brammertz Tim Oris Tom Aernouts Bart Vermang |
| author_facet | Jessica de Wild Guy Brammertz Tim Oris Tom Aernouts Bart Vermang |
| author_sort | Jessica de Wild |
| collection | DOAJ |
| description | Alkali post deposition treatments (PDT) are the standard method to increase the efficiency of Cu(In,Ga)Se _2 solar cells. In this study, the effects of potassium fluoride (KF) PDTs on narrow band gap Cu(In, Ga)Se _2 (CIS) layers are investigated. The CIS layers were grown on substrates such as glass with alkali-barrier/Mo, glass/Mo, and glass/indium-doped tin oxide. It was found that the effect of the PDT depends on the substrates and that there are conditions under which KF-PDT is detrimental to solar cell performance. Time-of-flight secondary ion mass spectrometry measurements revealed limited ion exchange between Na and K, which caused inhibited diffusion of K into the absorber layer. Further opto-electrical characterization indicated increased recombination in the solar cell. Capacitance–voltage–frequency measurements combined with modelling revealed the formation of an interface defect that is limiting the open circuit voltage and reducing the fill factor. Our findings suggest that the lack of K diffusion into the absorber layer promotes the formation of defects at the surface. This study highlights the complex interaction between alkali coming from PDT and the alkali already present in the absorber layer. |
| format | Article |
| id | doaj-art-ff7b1c6473834954ba5dcb4651d1a2f4 |
| institution | DOAJ |
| issn | 2515-7655 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | IOP Publishing |
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| spelling | doaj-art-ff7b1c6473834954ba5dcb4651d1a2f42025-08-20T03:23:30ZengIOP PublishingJPhys Energy2515-76552025-01-017404501110.1088/2515-7655/adeae6The effect of the substrate on KF post deposition treatments of narrow gap Cu(In,Ga)Se2 absorber layersJessica de Wild0https://orcid.org/0000-0003-2291-4674Guy Brammertz1https://orcid.org/0000-0003-1404-7339Tim Oris2https://orcid.org/0000-0003-0007-4918Tom Aernouts3https://orcid.org/0000-0002-3004-6080Bart Vermang4https://orcid.org/0000-0003-2669-2087Hasselt University, imo-imomec , Martelarenlaan 42, 3500 Hasselt, Belgium; Imec, imo-imomec , Thor Park 8320, 3600 Genk, Belgium; EnergyVille, imo-imomec , Thor Park 8320, 3600 Genk, BelgiumHasselt University, imo-imomec , Martelarenlaan 42, 3500 Hasselt, Belgium; Imec, imo-imomec , Thor Park 8320, 3600 Genk, Belgium; EnergyVille, imo-imomec , Thor Park 8320, 3600 Genk, BelgiumHasselt University, imo-imomec , Martelarenlaan 42, 3500 Hasselt, Belgium; Imec, imo-imomec , Thor Park 8320, 3600 Genk, Belgium; EnergyVille, imo-imomec , Thor Park 8320, 3600 Genk, BelgiumHasselt University, imo-imomec , Martelarenlaan 42, 3500 Hasselt, Belgium; Imec, imo-imomec , Thor Park 8320, 3600 Genk, Belgium; EnergyVille, imo-imomec , Thor Park 8320, 3600 Genk, BelgiumHasselt University, imo-imomec , Martelarenlaan 42, 3500 Hasselt, Belgium; Imec, imo-imomec , Thor Park 8320, 3600 Genk, Belgium; EnergyVille, imo-imomec , Thor Park 8320, 3600 Genk, BelgiumAlkali post deposition treatments (PDT) are the standard method to increase the efficiency of Cu(In,Ga)Se _2 solar cells. In this study, the effects of potassium fluoride (KF) PDTs on narrow band gap Cu(In, Ga)Se _2 (CIS) layers are investigated. The CIS layers were grown on substrates such as glass with alkali-barrier/Mo, glass/Mo, and glass/indium-doped tin oxide. It was found that the effect of the PDT depends on the substrates and that there are conditions under which KF-PDT is detrimental to solar cell performance. Time-of-flight secondary ion mass spectrometry measurements revealed limited ion exchange between Na and K, which caused inhibited diffusion of K into the absorber layer. Further opto-electrical characterization indicated increased recombination in the solar cell. Capacitance–voltage–frequency measurements combined with modelling revealed the formation of an interface defect that is limiting the open circuit voltage and reducing the fill factor. Our findings suggest that the lack of K diffusion into the absorber layer promotes the formation of defects at the surface. This study highlights the complex interaction between alkali coming from PDT and the alkali already present in the absorber layer.https://doi.org/10.1088/2515-7655/adeae6narrow band gap CIGSalkali treatmentToF-SIMS depth profilesbias dependent admittance spectroscopy |
| spellingShingle | Jessica de Wild Guy Brammertz Tim Oris Tom Aernouts Bart Vermang The effect of the substrate on KF post deposition treatments of narrow gap Cu(In,Ga)Se2 absorber layers JPhys Energy narrow band gap CIGS alkali treatment ToF-SIMS depth profiles bias dependent admittance spectroscopy |
| title | The effect of the substrate on KF post deposition treatments of narrow gap Cu(In,Ga)Se2 absorber layers |
| title_full | The effect of the substrate on KF post deposition treatments of narrow gap Cu(In,Ga)Se2 absorber layers |
| title_fullStr | The effect of the substrate on KF post deposition treatments of narrow gap Cu(In,Ga)Se2 absorber layers |
| title_full_unstemmed | The effect of the substrate on KF post deposition treatments of narrow gap Cu(In,Ga)Se2 absorber layers |
| title_short | The effect of the substrate on KF post deposition treatments of narrow gap Cu(In,Ga)Se2 absorber layers |
| title_sort | effect of the substrate on kf post deposition treatments of narrow gap cu in ga se2 absorber layers |
| topic | narrow band gap CIGS alkali treatment ToF-SIMS depth profiles bias dependent admittance spectroscopy |
| url | https://doi.org/10.1088/2515-7655/adeae6 |
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