Imaging performance of a CaWO4/CMOS sensor
The aim of this study was to investigate the modulation transfer function (MTF) and the effective gain transfer function (eGTF) of a non-destructive testing (NDT)/industrial inspection complementary metal oxide semiconductor (CMOS) sensor in conjunction with a thin calcium tungstate (CaWO4) scree...
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Language: | English |
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Gruppo Italiano Frattura
2019-09-01
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Series: | Fracture and Structural Integrity |
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Online Access: | https://www.fracturae.com/index.php/fis/article/view/2614 |
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author | Niki Martini Vaia Koukou George Fountos Ioannis Valais Ioannis Kandarakis Christos Michail Athanasios Bakas Eleftherios Lavdas Konstantinos Ninos Georgia Oikonomou Lida Gogou George Panayiotakis |
author_facet | Niki Martini Vaia Koukou George Fountos Ioannis Valais Ioannis Kandarakis Christos Michail Athanasios Bakas Eleftherios Lavdas Konstantinos Ninos Georgia Oikonomou Lida Gogou George Panayiotakis |
author_sort | Niki Martini |
collection | DOAJ |
description | The aim of this study was to investigate the modulation transfer function (MTF) and the effective gain transfer function (eGTF) of a non-destructive testing (NDT)/industrial inspection complementary metal oxide semiconductor (CMOS) sensor in conjunction with a thin calcium tungstate (CaWO4) screen. Thin screen samples, with dimensions of 2.7x3.6 cm2 and thickness of 118.9 μm, estimated from scanning electron microscopy-SEM images, were extracted from an Agfa Curix universal screen and coupled to the active area of an active pixel (APS) CMOS sensor. MTF was assessed using the slanted-edge method, following the IEC 62220-1-1:2015 method. MTF values were found high across the examined spatial frequency range. eGTF was found maximum when CaWO4 was combined with charge-coupled devices (CCD) of broadband anti-reflection (AR) coating (17.52 at 0 cycles/mm). The combination of the thin CaWO4 screen with the CMOS sensor provided very promising image resolution and adequate efficiency properties, thus could be also considered for use in CMOS based X-ray imaging devices, for various applications. |
format | Article |
id | doaj-art-ff2be550715142f4b670aa6a168fc179 |
institution | Kabale University |
issn | 1971-8993 |
language | English |
publishDate | 2019-09-01 |
publisher | Gruppo Italiano Frattura |
record_format | Article |
series | Fracture and Structural Integrity |
spelling | doaj-art-ff2be550715142f4b670aa6a168fc1792025-01-03T00:40:24ZengGruppo Italiano FratturaFracture and Structural Integrity1971-89932019-09-011350Imaging performance of a CaWO4/CMOS sensorNiki Martini0Vaia Koukou1George Fountos2Ioannis Valais3Ioannis Kandarakis4Christos Michail5Athanasios Bakas6Eleftherios Lavdas7Konstantinos Ninos8Georgia Oikonomou9Lida Gogou10George Panayiotakis11University of West AtticaUniversity of West AtticaUniversity of West AtticaUniversity of West AtticaUniversity of West AtticaUniversity of West AtticaUniversity of West AtticaUniversity of West AtticaUniversity of West AtticaUniversity of West AtticaUniversity of West AtticaDepartment of Medical Physics, Faculty of Medicine, University of PatrasThe aim of this study was to investigate the modulation transfer function (MTF) and the effective gain transfer function (eGTF) of a non-destructive testing (NDT)/industrial inspection complementary metal oxide semiconductor (CMOS) sensor in conjunction with a thin calcium tungstate (CaWO4) screen. Thin screen samples, with dimensions of 2.7x3.6 cm2 and thickness of 118.9 μm, estimated from scanning electron microscopy-SEM images, were extracted from an Agfa Curix universal screen and coupled to the active area of an active pixel (APS) CMOS sensor. MTF was assessed using the slanted-edge method, following the IEC 62220-1-1:2015 method. MTF values were found high across the examined spatial frequency range. eGTF was found maximum when CaWO4 was combined with charge-coupled devices (CCD) of broadband anti-reflection (AR) coating (17.52 at 0 cycles/mm). The combination of the thin CaWO4 screen with the CMOS sensor provided very promising image resolution and adequate efficiency properties, thus could be also considered for use in CMOS based X-ray imaging devices, for various applications.https://www.fracturae.com/index.php/fis/article/view/2614CaWO4PhosphorsMedical imagingAPSCMOS sensorsMTF |
spellingShingle | Niki Martini Vaia Koukou George Fountos Ioannis Valais Ioannis Kandarakis Christos Michail Athanasios Bakas Eleftherios Lavdas Konstantinos Ninos Georgia Oikonomou Lida Gogou George Panayiotakis Imaging performance of a CaWO4/CMOS sensor Fracture and Structural Integrity CaWO4 Phosphors Medical imaging APS CMOS sensors MTF |
title | Imaging performance of a CaWO4/CMOS sensor |
title_full | Imaging performance of a CaWO4/CMOS sensor |
title_fullStr | Imaging performance of a CaWO4/CMOS sensor |
title_full_unstemmed | Imaging performance of a CaWO4/CMOS sensor |
title_short | Imaging performance of a CaWO4/CMOS sensor |
title_sort | imaging performance of a cawo4 cmos sensor |
topic | CaWO4 Phosphors Medical imaging APS CMOS sensors MTF |
url | https://www.fracturae.com/index.php/fis/article/view/2614 |
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