Jiang, Z., Zhuang, Y., Li, C., Wang, P., & Liu, Y. Impact of Interface Traps on Direct and Alternating Current in Tunneling Field-Effect Transistors. Wiley.
Chicago Style (17th ed.) CitationJiang, Zhi, Yiqi Zhuang, Cong Li, Ping Wang, and Yuqi Liu. Impact of Interface Traps on Direct and Alternating Current in Tunneling Field-Effect Transistors. Wiley.
MLA (9th ed.) CitationJiang, Zhi, et al. Impact of Interface Traps on Direct and Alternating Current in Tunneling Field-Effect Transistors. Wiley.
Warning: These citations may not always be 100% accurate.