Orientation dependent resistivity scaling in mesoscopic NbP crystals

Abstract The scaling of Si transistor technology has resulted in a remarkable improvement in the performance of integrated circuits over the last decades. However, scaled transistors also require reduced electrical interconnect dimensions, which lead to greater losses and power dissipation at circui...

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Main Authors: Gianluca Mariani, Federico Balduini, Nathan Drucker, Lorenzo Rocchino, Vicky Hasse, Claudia Felser, Heinz Schmid, Cezar Zota, Bernd Gotsmann
Format: Article
Language:English
Published: Nature Portfolio 2025-05-01
Series:Communications Materials
Online Access:https://doi.org/10.1038/s43246-025-00828-w
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_version_ 1850242860355420160
author Gianluca Mariani
Federico Balduini
Nathan Drucker
Lorenzo Rocchino
Vicky Hasse
Claudia Felser
Heinz Schmid
Cezar Zota
Bernd Gotsmann
author_facet Gianluca Mariani
Federico Balduini
Nathan Drucker
Lorenzo Rocchino
Vicky Hasse
Claudia Felser
Heinz Schmid
Cezar Zota
Bernd Gotsmann
author_sort Gianluca Mariani
collection DOAJ
description Abstract The scaling of Si transistor technology has resulted in a remarkable improvement in the performance of integrated circuits over the last decades. However, scaled transistors also require reduced electrical interconnect dimensions, which lead to greater losses and power dissipation at circuit level. This is mainly caused by enhanced surface scattering of charge carriers in copper interconnect wires at dimensions below 30 nm. A promising approach to mitigate this issue is to use directional conductors, i.e. materials with anisotropic Fermi surface, where proper alignment of crystalline orientation and transport direction can minimize surface scattering. In this work, we perform a resistivity scaling study of the anisotropic semimetal NbP as a function of crystalline orientation. We use here focused ion beam to pattern and scale down NbP crystallites to dimensions comparable to the electron scattering length at cryogenic temperatures. The experimental transport properties are correlated with the Fermi surface characteristics through a theoretical model, thus identifying the physical mechanisms that influence the resistivity scaling of anisotropic conductors. Our methodology provides an effective approach for early evaluation of anisotropic materials as future ultra-scalable interconnects, even when they are unavailable as epitaxial films.
format Article
id doaj-art-fe538f66c6284c129c0eed3d8a103be7
institution OA Journals
issn 2662-4443
language English
publishDate 2025-05-01
publisher Nature Portfolio
record_format Article
series Communications Materials
spelling doaj-art-fe538f66c6284c129c0eed3d8a103be72025-08-20T02:00:09ZengNature PortfolioCommunications Materials2662-44432025-05-01611710.1038/s43246-025-00828-wOrientation dependent resistivity scaling in mesoscopic NbP crystalsGianluca Mariani0Federico Balduini1Nathan Drucker2Lorenzo Rocchino3Vicky Hasse4Claudia Felser5Heinz Schmid6Cezar Zota7Bernd Gotsmann8IBM Research Europe - ZurichIBM Research Europe - ZurichIBM Research Europe - ZurichIBM Research Europe - ZurichMax Planck Institute for Chemical Physics of SolidsMax Planck Institute for Chemical Physics of SolidsIBM Research Europe - ZurichIBM Research Europe - ZurichIBM Research Europe - ZurichAbstract The scaling of Si transistor technology has resulted in a remarkable improvement in the performance of integrated circuits over the last decades. However, scaled transistors also require reduced electrical interconnect dimensions, which lead to greater losses and power dissipation at circuit level. This is mainly caused by enhanced surface scattering of charge carriers in copper interconnect wires at dimensions below 30 nm. A promising approach to mitigate this issue is to use directional conductors, i.e. materials with anisotropic Fermi surface, where proper alignment of crystalline orientation and transport direction can minimize surface scattering. In this work, we perform a resistivity scaling study of the anisotropic semimetal NbP as a function of crystalline orientation. We use here focused ion beam to pattern and scale down NbP crystallites to dimensions comparable to the electron scattering length at cryogenic temperatures. The experimental transport properties are correlated with the Fermi surface characteristics through a theoretical model, thus identifying the physical mechanisms that influence the resistivity scaling of anisotropic conductors. Our methodology provides an effective approach for early evaluation of anisotropic materials as future ultra-scalable interconnects, even when they are unavailable as epitaxial films.https://doi.org/10.1038/s43246-025-00828-w
spellingShingle Gianluca Mariani
Federico Balduini
Nathan Drucker
Lorenzo Rocchino
Vicky Hasse
Claudia Felser
Heinz Schmid
Cezar Zota
Bernd Gotsmann
Orientation dependent resistivity scaling in mesoscopic NbP crystals
Communications Materials
title Orientation dependent resistivity scaling in mesoscopic NbP crystals
title_full Orientation dependent resistivity scaling in mesoscopic NbP crystals
title_fullStr Orientation dependent resistivity scaling in mesoscopic NbP crystals
title_full_unstemmed Orientation dependent resistivity scaling in mesoscopic NbP crystals
title_short Orientation dependent resistivity scaling in mesoscopic NbP crystals
title_sort orientation dependent resistivity scaling in mesoscopic nbp crystals
url https://doi.org/10.1038/s43246-025-00828-w
work_keys_str_mv AT gianlucamariani orientationdependentresistivityscalinginmesoscopicnbpcrystals
AT federicobalduini orientationdependentresistivityscalinginmesoscopicnbpcrystals
AT nathandrucker orientationdependentresistivityscalinginmesoscopicnbpcrystals
AT lorenzorocchino orientationdependentresistivityscalinginmesoscopicnbpcrystals
AT vickyhasse orientationdependentresistivityscalinginmesoscopicnbpcrystals
AT claudiafelser orientationdependentresistivityscalinginmesoscopicnbpcrystals
AT heinzschmid orientationdependentresistivityscalinginmesoscopicnbpcrystals
AT cezarzota orientationdependentresistivityscalinginmesoscopicnbpcrystals
AT berndgotsmann orientationdependentresistivityscalinginmesoscopicnbpcrystals