High-pressure research on optoelectronic materials: Insights from in situ characterization methods
High-pressure research has emerged as a pivotal approach for advancing our understanding and development of optoelectronic materials, which are vital for a wide range of applications, including photovoltaics, light-emitting devices, and photodetectors. This review highlights various in situ characte...
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2025-05-01
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| Series: | Matter and Radiation at Extremes |
| Online Access: | http://dx.doi.org/10.1063/5.0258375 |
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| author | Songhao Guo Yiqiang Zhan Xujie Lü |
| author_facet | Songhao Guo Yiqiang Zhan Xujie Lü |
| author_sort | Songhao Guo |
| collection | DOAJ |
| description | High-pressure research has emerged as a pivotal approach for advancing our understanding and development of optoelectronic materials, which are vital for a wide range of applications, including photovoltaics, light-emitting devices, and photodetectors. This review highlights various in situ characterization methods employed in high-pressure research to investigate the optical, electronic, and structural properties of optoelectronic materials. We explore the advances that have been made in techniques such as X-ray diffraction, absorption spectroscopy, nonlinear optics, photoluminescence spectroscopy, Raman spectroscopy, and photoresponse measurement, emphasizing how these methods have enhanced the elucidation of structural transitions, bandgap modulation, performance optimization, and carrier dynamics engineering. These insights underscore the pivotal role of high-pressure techniques in optimizing and tailoring optoelectronic materials for future applications. |
| format | Article |
| id | doaj-art-fe35e4664f4e4e3d848e228022f0fd97 |
| institution | Kabale University |
| issn | 2468-080X |
| language | English |
| publishDate | 2025-05-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | Matter and Radiation at Extremes |
| spelling | doaj-art-fe35e4664f4e4e3d848e228022f0fd972025-08-20T03:37:17ZengAIP Publishing LLCMatter and Radiation at Extremes2468-080X2025-05-01103033802033802-1410.1063/5.0258375High-pressure research on optoelectronic materials: Insights from in situ characterization methodsSonghao GuoYiqiang Zhan0Xujie Lü1Center of Micro–Nano Systems, School of Information Science and Technology, Fudan University, Shanghai 200433, ChinaCenter for High Pressure Science and Technology Advanced Research (HPSTAR), Shanghai, ChinaHigh-pressure research has emerged as a pivotal approach for advancing our understanding and development of optoelectronic materials, which are vital for a wide range of applications, including photovoltaics, light-emitting devices, and photodetectors. This review highlights various in situ characterization methods employed in high-pressure research to investigate the optical, electronic, and structural properties of optoelectronic materials. We explore the advances that have been made in techniques such as X-ray diffraction, absorption spectroscopy, nonlinear optics, photoluminescence spectroscopy, Raman spectroscopy, and photoresponse measurement, emphasizing how these methods have enhanced the elucidation of structural transitions, bandgap modulation, performance optimization, and carrier dynamics engineering. These insights underscore the pivotal role of high-pressure techniques in optimizing and tailoring optoelectronic materials for future applications.http://dx.doi.org/10.1063/5.0258375 |
| spellingShingle | Songhao Guo Yiqiang Zhan Xujie Lü High-pressure research on optoelectronic materials: Insights from in situ characterization methods Matter and Radiation at Extremes |
| title | High-pressure research on optoelectronic materials: Insights from in situ characterization methods |
| title_full | High-pressure research on optoelectronic materials: Insights from in situ characterization methods |
| title_fullStr | High-pressure research on optoelectronic materials: Insights from in situ characterization methods |
| title_full_unstemmed | High-pressure research on optoelectronic materials: Insights from in situ characterization methods |
| title_short | High-pressure research on optoelectronic materials: Insights from in situ characterization methods |
| title_sort | high pressure research on optoelectronic materials insights from in situ characterization methods |
| url | http://dx.doi.org/10.1063/5.0258375 |
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