Automatic optical inspection of microscale defects on curved surfaces
In many areas of manufacturing, there is a growing need for imaging technology that non-destructively inspects the surface of products. However, detecting micro-defects on curved surfaces is challenging because the appropriate imaging conditions can vary depending on the shape of the curved surface....
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| Format: | Article |
| Language: | Japanese |
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The Japan Society of Mechanical Engineers
2024-12-01
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| Series: | Nihon Kikai Gakkai ronbunshu |
| Subjects: | |
| Online Access: | https://www.jstage.jst.go.jp/article/transjsme/91/941/91_24-00145/_pdf/-char/en |
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| _version_ | 1832584970981343232 |
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| author | Hiroya KANO Hiroshi OHNO Hideaki OKANO |
| author_facet | Hiroya KANO Hiroshi OHNO Hideaki OKANO |
| author_sort | Hiroya KANO |
| collection | DOAJ |
| description | In many areas of manufacturing, there is a growing need for imaging technology that non-destructively inspects the surface of products. However, detecting micro-defects on curved surfaces is challenging because the appropriate imaging conditions can vary depending on the shape of the curved surface. To address this problem, we have developed a method for visualizing micro-defects on curved surfaces that uses an imaging system to obtain a color map of light directions reflected from the surface. This imaging system is equipped with a stripe-patterned multicolor filter and a radially diffusing illumination light. The unique characteristics of this imaging system enable it to capture drastic spatial changes in the direction of light, which are caused by micro-defects on the curved surfaces, as differences in image color. Furthermore, we have also constructed an image-processing algorithm that automatically detects these micro-defects. The key point of this image-processing algorithm is that it automatically detects areas where drastic color changes have occurred due to micro-defects by using spatial frequency filtering techniques. As a result, the developed method was shown to have the ability to automatically detect micro-defects on curved surfaces with depths of several tens of micrometers. |
| format | Article |
| id | doaj-art-fca4b5f12a5542aa8f2c8d64756c5e71 |
| institution | Kabale University |
| issn | 2187-9761 |
| language | Japanese |
| publishDate | 2024-12-01 |
| publisher | The Japan Society of Mechanical Engineers |
| record_format | Article |
| series | Nihon Kikai Gakkai ronbunshu |
| spelling | doaj-art-fca4b5f12a5542aa8f2c8d64756c5e712025-01-27T08:34:35ZjpnThe Japan Society of Mechanical EngineersNihon Kikai Gakkai ronbunshu2187-97612024-12-019194124-0014524-0014510.1299/transjsme.24-00145transjsmeAutomatic optical inspection of microscale defects on curved surfacesHiroya KANO0Hiroshi OHNO1Hideaki OKANO2R&D Center, Toshiba CorporationR&D Center, Toshiba CorporationR&D Center, Toshiba CorporationIn many areas of manufacturing, there is a growing need for imaging technology that non-destructively inspects the surface of products. However, detecting micro-defects on curved surfaces is challenging because the appropriate imaging conditions can vary depending on the shape of the curved surface. To address this problem, we have developed a method for visualizing micro-defects on curved surfaces that uses an imaging system to obtain a color map of light directions reflected from the surface. This imaging system is equipped with a stripe-patterned multicolor filter and a radially diffusing illumination light. The unique characteristics of this imaging system enable it to capture drastic spatial changes in the direction of light, which are caused by micro-defects on the curved surfaces, as differences in image color. Furthermore, we have also constructed an image-processing algorithm that automatically detects these micro-defects. The key point of this image-processing algorithm is that it automatically detects areas where drastic color changes have occurred due to micro-defects by using spatial frequency filtering techniques. As a result, the developed method was shown to have the ability to automatically detect micro-defects on curved surfaces with depths of several tens of micrometers.https://www.jstage.jst.go.jp/article/transjsme/91/941/91_24-00145/_pdf/-char/enimagingopticsmicro-defectscurved surfacesautomatic inspection |
| spellingShingle | Hiroya KANO Hiroshi OHNO Hideaki OKANO Automatic optical inspection of microscale defects on curved surfaces Nihon Kikai Gakkai ronbunshu imaging optics micro-defects curved surfaces automatic inspection |
| title | Automatic optical inspection of microscale defects on curved surfaces |
| title_full | Automatic optical inspection of microscale defects on curved surfaces |
| title_fullStr | Automatic optical inspection of microscale defects on curved surfaces |
| title_full_unstemmed | Automatic optical inspection of microscale defects on curved surfaces |
| title_short | Automatic optical inspection of microscale defects on curved surfaces |
| title_sort | automatic optical inspection of microscale defects on curved surfaces |
| topic | imaging optics micro-defects curved surfaces automatic inspection |
| url | https://www.jstage.jst.go.jp/article/transjsme/91/941/91_24-00145/_pdf/-char/en |
| work_keys_str_mv | AT hiroyakano automaticopticalinspectionofmicroscaledefectsoncurvedsurfaces AT hiroshiohno automaticopticalinspectionofmicroscaledefectsoncurvedsurfaces AT hideakiokano automaticopticalinspectionofmicroscaledefectsoncurvedsurfaces |