Automatic optical inspection of microscale defects on curved surfaces
In many areas of manufacturing, there is a growing need for imaging technology that non-destructively inspects the surface of products. However, detecting micro-defects on curved surfaces is challenging because the appropriate imaging conditions can vary depending on the shape of the curved surface....
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| Main Authors: | , , |
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| Format: | Article |
| Language: | Japanese |
| Published: |
The Japan Society of Mechanical Engineers
2024-12-01
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| Series: | Nihon Kikai Gakkai ronbunshu |
| Subjects: | |
| Online Access: | https://www.jstage.jst.go.jp/article/transjsme/91/941/91_24-00145/_pdf/-char/en |
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| Summary: | In many areas of manufacturing, there is a growing need for imaging technology that non-destructively inspects the surface of products. However, detecting micro-defects on curved surfaces is challenging because the appropriate imaging conditions can vary depending on the shape of the curved surface. To address this problem, we have developed a method for visualizing micro-defects on curved surfaces that uses an imaging system to obtain a color map of light directions reflected from the surface. This imaging system is equipped with a stripe-patterned multicolor filter and a radially diffusing illumination light. The unique characteristics of this imaging system enable it to capture drastic spatial changes in the direction of light, which are caused by micro-defects on the curved surfaces, as differences in image color. Furthermore, we have also constructed an image-processing algorithm that automatically detects these micro-defects. The key point of this image-processing algorithm is that it automatically detects areas where drastic color changes have occurred due to micro-defects by using spatial frequency filtering techniques. As a result, the developed method was shown to have the ability to automatically detect micro-defects on curved surfaces with depths of several tens of micrometers. |
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| ISSN: | 2187-9761 |