Using Spice Circuit Simulation Program in Reliability Analysis of Redundant Systems with Non-Repairable Units and Common-Cause Failures

The effectiveness of Simulation Program with Integrated Circuit Emphasis (SPICE) in calculating probabilities, reliability, steady-state availability and mean-time to failure of redundant systems with non-repairable units and common-cause failures described by Markov models is demonstrated. General...

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Main Authors: Muhammad Taher Abuelma'atti, Isa Salman Qamber
Format: Article
Language:English
Published: Wiley 2000-01-01
Series:Active and Passive Electronic Components
Subjects:
Online Access:http://dx.doi.org/10.1155/2000/85913
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author Muhammad Taher Abuelma'atti
Isa Salman Qamber
author_facet Muhammad Taher Abuelma'atti
Isa Salman Qamber
author_sort Muhammad Taher Abuelma'atti
collection DOAJ
description The effectiveness of Simulation Program with Integrated Circuit Emphasis (SPICE) in calculating probabilities, reliability, steady-state availability and mean-time to failure of redundant systems with non-repairable units and common-cause failures described by Markov models is demonstrated. General equations and procedure for constructing the equivalent circuit for N parallel units are presented. Results obtained, for N=1,2,3, using SPICE are compared with previously published results obtained using the Laplace transform method. Full SPICE listings are included.
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institution Kabale University
issn 0882-7516
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publishDate 2000-01-01
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series Active and Passive Electronic Components
spelling doaj-art-fbd477b2adbd49038ea0e121f346147a2025-02-03T06:01:49ZengWileyActive and Passive Electronic Components0882-75161563-50312000-01-0122423525510.1155/2000/85913Using Spice Circuit Simulation Program in Reliability Analysis of Redundant Systems with Non-Repairable Units and Common-Cause FailuresMuhammad Taher Abuelma'atti0Isa Salman Qamber1King Fahd University of Petroleum and Minerals, Box 203, Dhahran 31261, Saudi ArabiaUniversity of Bahrain, P.O. Box 32038, Isa Town, BahrainThe effectiveness of Simulation Program with Integrated Circuit Emphasis (SPICE) in calculating probabilities, reliability, steady-state availability and mean-time to failure of redundant systems with non-repairable units and common-cause failures described by Markov models is demonstrated. General equations and procedure for constructing the equivalent circuit for N parallel units are presented. Results obtained, for N=1,2,3, using SPICE are compared with previously published results obtained using the Laplace transform method. Full SPICE listings are included.http://dx.doi.org/10.1155/2000/85913ReliabilitySPICE simulation.
spellingShingle Muhammad Taher Abuelma'atti
Isa Salman Qamber
Using Spice Circuit Simulation Program in Reliability Analysis of Redundant Systems with Non-Repairable Units and Common-Cause Failures
Active and Passive Electronic Components
Reliability
SPICE simulation.
title Using Spice Circuit Simulation Program in Reliability Analysis of Redundant Systems with Non-Repairable Units and Common-Cause Failures
title_full Using Spice Circuit Simulation Program in Reliability Analysis of Redundant Systems with Non-Repairable Units and Common-Cause Failures
title_fullStr Using Spice Circuit Simulation Program in Reliability Analysis of Redundant Systems with Non-Repairable Units and Common-Cause Failures
title_full_unstemmed Using Spice Circuit Simulation Program in Reliability Analysis of Redundant Systems with Non-Repairable Units and Common-Cause Failures
title_short Using Spice Circuit Simulation Program in Reliability Analysis of Redundant Systems with Non-Repairable Units and Common-Cause Failures
title_sort using spice circuit simulation program in reliability analysis of redundant systems with non repairable units and common cause failures
topic Reliability
SPICE simulation.
url http://dx.doi.org/10.1155/2000/85913
work_keys_str_mv AT muhammadtaherabuelmaatti usingspicecircuitsimulationprograminreliabilityanalysisofredundantsystemswithnonrepairableunitsandcommoncausefailures
AT isasalmanqamber usingspicecircuitsimulationprograminreliabilityanalysisofredundantsystemswithnonrepairableunitsandcommoncausefailures