APA (7th ed.) Citation

Abbassi, A. E., Amhouche, Y., Bendada, E., Rmaily, R., & Raïs, K. Characterization of Series Resistances and Mobility Attenuation Phenomena in Short Channel MOS Transistors. Wiley.

Chicago Style (17th ed.) Citation

Abbassi, A. El, Y. Amhouche, E. Bendada, R. Rmaily, and K. Raïs. Characterization of Series Resistances and Mobility Attenuation Phenomena in Short Channel MOS Transistors. Wiley.

MLA (9th ed.) Citation

Abbassi, A. El, et al. Characterization of Series Resistances and Mobility Attenuation Phenomena in Short Channel MOS Transistors. Wiley.